{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:50:54Z","timestamp":1729666254239,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/etw.2003.1231664","type":"proceedings-article","created":{"date-parts":[[2004,1,24]],"date-time":"2004-01-24T04:33:03Z","timestamp":1074918783000},"page":"23-28","source":"Crossref","is-referenced-by-count":30,"title":["Defect-oriented dynamic fault models for embedded-SRAMs"],"prefix":"10.1109","author":[{"given":"S.","family":"Borri","sequence":"first","affiliation":[]},{"given":"M.","family":"Hage-Hassan","sequence":"additional","affiliation":[]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[]},{"given":"S.","family":"Pravossoudovitch","sequence":"additional","affiliation":[]},{"given":"A.","family":"Virazel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743133"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"18","DOI":"10.1109\/MDT.2002.1033788","article-title":"Resistance Characterization of Interconnect Weak and Strong Open Defects","volume":"19","author":"rodriquez","year":"2002","journal-title":"IEEE Design & Test of Computers"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/54.587738"},{"key":"ref13","first-page":"236","article-title":"Simple and Efficient Algorithms for Functional RAM Testing","author":"marinescu","year":"1982","journal-title":"Proc Int'l Test Conf (ITC)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743137"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843856"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915069"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805831"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/307418.307577"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1997.619391"},{"key":"ref3","article-title":"Analysis of Deceptive Destructive Read Memory Fault Model and Recommended Testing","author":"adams","year":"1996","journal-title":"IEEE North Atlantic Test Workshop (NATW)"},{"key":"ref6","article-title":"Testing Semiconductor Memories","author":"van de goor","year":"1998","journal-title":"Theory and Practice"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2000.868625"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805769"},{"journal-title":"High Performance Memory Testing","year":"2002","author":"adams","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1996.494336"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/54.199799"},{"key":"ref9","first-page":"1049","article-title":"Testing for Resistive Opens and Stuck Opens","author":"james","year":"2001","journal-title":"Proc Int'l Test Conf (ITC)"}],"event":{"name":"8th IEEE European Test Workshop (ETW 03)","acronym":"ETW-03","location":"Maastricht, Netherlands"},"container-title":["The Eighth IEEE European Test Workshop, 2003. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8721\/27596\/01231664.pdf?arnumber=1231664","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T03:18:34Z","timestamp":1497583114000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1231664\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/etw.2003.1231664","relation":{},"subject":[]}}