{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T05:44:08Z","timestamp":1725687848943},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2003]]},"DOI":"10.1109\/eurmic.2003.1231574","type":"proceedings-article","created":{"date-parts":[[2004,5,6]],"date-time":"2004-05-06T20:18:03Z","timestamp":1083874683000},"page":"107-114","source":"Crossref","is-referenced-by-count":10,"title":["Merging components and testing tools: the self-testing COTS components (STECC) strategy"],"prefix":"10.1109","author":[{"family":"Beydeda","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Gruhn","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Software Engineering","year":"2001","author":"sommerville","key":"19"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/52.663777"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2000.870394"},{"key":"23","first-page":"186","article-title":"A method for built-in tests in component-based software maintenance","author":"wang","year":"1999","journal-title":"6th European Conference on Software Maintenance and Reengineering (CSMR 2002)"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(01)00147-9"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/52.714817"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2001.936221"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2001.941401"},{"key":"13","article-title":"An approach to analyzing and testing component-based systems","author":"harrold","year":"1999","journal-title":"International ICSE Workshop Testing Distributed Component-Based Systems"},{"key":"14","article-title":"Test reuse in cbse using built-in tests","author":"ho?rnstein","year":"2002","journal-title":"Workshop on Component-based Software Engineering Composing systems from components"},{"key":"11","article-title":"Toward reflective metadata wrappers for formally specified software components","author":"edwards","year":"2001","journal-title":"OOPSLA Workshop Specification and Verification of Component-Based Systems (SAVCBS"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1145\/336512.336532"},{"key":"21","doi-asserted-by":"crossref","first-page":"96","DOI":"10.1109\/TOOLS.1999.779003","article-title":"Self-testable components: From pragmatic tests to design-to-testability methodology","author":"traon","year":"1999","journal-title":"Proc Technology of Object-Oriented Languages and Systems (TOOLS)"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-5939-6_9"},{"journal-title":"Component Software Beyond Object Oriented Programming","year":"1998","author":"szyperski","key":"20"},{"key":"2","first-page":"69","article-title":"Trustable components: Yet another mutation-based approach","author":"baudry","year":"2000","journal-title":"Symposium on Mutation Testing (Mutation)"},{"key":"1","article-title":"Built-in contract testing in model-driven, component-based development","author":"atkinson","year":"2002","journal-title":"ICSR Workshop on Component-Based Development Processes"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.224"},{"journal-title":"Enterprise JavaBeans Specification Version 2 1","year":"2002","author":"demichiel","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/52.841700"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2003.1319097"},{"journal-title":"The Self-Testing COTS Components (STECC) Method","year":"2003","author":"beydeda","key":"4"},{"key":"9","article-title":"A framework for practical, automated blackbox testing of component-based software","author":"edwards","year":"2000","journal-title":"International ICSE Workshop on Automated Program Analysis Testing and Verification"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ASWEC.2001.948491"}],"event":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat No 03CH37412) EURMIC-03","start":{"date-parts":[[2003,9,6]]},"location":"Belek-Antalya, Turkey","end":{"date-parts":[[2003,9,6]]}},"container-title":["Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat No 03CH37412) EURMIC-03"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8716\/27589\/01231574.pdf?arnumber=1231574","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,4,2]],"date-time":"2020-04-02T02:23:03Z","timestamp":1585794183000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1231574\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/eurmic.2003.1231574","relation":{},"subject":[],"published":{"date-parts":[[2003]]}}}