{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:41:05Z","timestamp":1725784865859},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/ewdts.2008.5580138","type":"proceedings-article","created":{"date-parts":[[2010,9,22]],"date-time":"2010-09-22T19:57:51Z","timestamp":1285185471000},"page":"375-378","source":"Crossref","is-referenced-by-count":1,"title":["Performance evaluation of In-Circuit Testing on QCA based circuits"],"prefix":"10.1109","author":[{"given":"Nasim","family":"Kazemi-fard","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maryam","family":"Ebrahimpour","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mostafa","family":"Rahimi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammad","family":"Tehrani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Keivan","family":"Navi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855308"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2005.157"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269110"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.356375"}],"event":{"name":"Test Symposium (EWDTS)","start":{"date-parts":[[2008,10,9]]},"location":"Lviv, Ukraine","end":{"date-parts":[[2008,10,12]]}},"container-title":["Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5570120\/5580134\/05580138.pdf?arnumber=5580138","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T22:01:06Z","timestamp":1489874466000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5580138\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2008.5580138","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}