{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T22:00:43Z","timestamp":1725400843589},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/ewdts.2008.5580143","type":"proceedings-article","created":{"date-parts":[[2010,9,22]],"date-time":"2010-09-22T19:57:51Z","timestamp":1285185471000},"page":"371-375","source":"Crossref","is-referenced-by-count":5,"title":["Utilizing HDL simulation engines for accelerating design and test processes"],"prefix":"10.1109","author":[{"given":"Najmeh","family":"Farajipour","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. Behdad","family":"Hosseini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zainalabedin","family":"Navabi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/0471457787"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VIUF.1994.323969"},{"key":"ref6","article-title":"A Fast Algorithm for Critical Path Tracing in VLSI Digital Circuits","author":"wu","year":"2005","journal-title":"IEEE Int Symposium on Defect and Fault Tolerance in VLSI Systems"},{"key":"ref5","article-title":"Line Oriented Structural Equivalence Fault Collapsing","author":"nadjarbashi","year":"2000","journal-title":"IEEE Workshop on Model and Test"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MC.1974.6323496"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.58"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10677-004-4247-z"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1993.393403"},{"journal-title":"VHDL Modular Design and Synthesis of Cores and Systems","year":"1998","author":"navabi","key":"ref1"}],"event":{"name":"Test Symposium (EWDTS)","start":{"date-parts":[[2008,10,9]]},"location":"Lviv, Ukraine","end":{"date-parts":[[2008,10,12]]}},"container-title":["Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5570120\/5580134\/05580143.pdf?arnumber=5580143","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T21:23:00Z","timestamp":1489872180000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5580143\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2008.5580143","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}