{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:43:01Z","timestamp":1729622581635,"version":"3.28.0"},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/ewdts.2010.5742045","type":"proceedings-article","created":{"date-parts":[[2011,4,7]],"date-time":"2011-04-07T12:00:27Z","timestamp":1302177627000},"page":"160-163","source":"Crossref","is-referenced-by-count":2,"title":["PDFs testing of combinational circuits based on covering ROBDDs"],"prefix":"10.1109","author":[{"given":"A.","family":"Matrosova","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Nikolaeva","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref3","first-page":"432","article-title":"Essentials of ElectronicTesting for Digital, Memory, And Mixed-Signal VLSI Circuits","author":"bushnell","year":"2000"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"694","DOI":"10.1109\/TCAD.1987.1270315","article-title":"On Delay Fault Testing in Logic Circuits","volume":"6","author":"lin","year":"1987","journal-title":"IEEE Trans on Computer- Aided Design"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/DFT.2007.42"}],"event":{"name":"Test Symposium (EWDTS)","start":{"date-parts":[[2010,9,17]]},"location":"St. Petersburg, Russia","end":{"date-parts":[[2010,9,20]]}},"container-title":["2010 East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5738234\/5742029\/05742045.pdf?arnumber=5742045","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T18:11:29Z","timestamp":1497895889000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5742045\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2010.5742045","relation":{},"subject":[],"published":{"date-parts":[[2010,9]]}}}