{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T00:56:10Z","timestamp":1729644970245,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/ewdts.2010.5742055","type":"proceedings-article","created":{"date-parts":[[2011,4,7]],"date-time":"2011-04-07T16:00:27Z","timestamp":1302192027000},"page":"69-72","source":"Crossref","is-referenced-by-count":0,"title":["Improving reliability for bit parallel finite field multipliers using Decimal Hamming"],"prefix":"10.1109","author":[{"given":"Nikolaos","family":"Mavrogiannakis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Costas","family":"Argyrides","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dhiraj K.","family":"Pradhan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675077"},{"journal-title":"Fault-Tolerant Computer System Design","year":"1996","author":"pradhan","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2004.47"},{"key":"ref13","first-page":"1089","volume":"55","author":"reyhani-masoleh","year":"2006","journal-title":"Fault detection architectures for field multiplication using polynomial bases"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2010.64"},{"key":"ref4","first-page":"29","volume":"13","author":"fenn","year":"1998","journal-title":"Online error detection for bit-serial multipliers in gf$(2^ m )$"},{"key":"ref3","first-page":"33","volume":"36","author":"ciet","year":"2005","journal-title":"Elliptic Curve Cryptosystems in the Presence of Permanent and Transient Faults"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"journal-title":"Error Detection Circuits","year":"1993","author":"gossel","key":"ref5"},{"journal-title":"VLSI architectures for computation in Galois fields","year":"1991","author":"mastrovito","key":"ref8"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"930","DOI":"10.1145\/1391469.1391704","article-title":"Study of the effects of MBUs on the reliability of a 150nm SRAM device","author":"maestro","year":"2008","journal-title":"Proc 45th Design Automation Conf (DAC 08)"},{"key":"ref2","first-page":"930","article-title":"Single element correction in sorting algorithms with minimum delay overhead","author":"argyrides","year":"2008","journal-title":"At the 10th IEEE Latin-American Test Workshop (LATW09)"},{"journal-title":"Robust finite field arithmetic for fault-tolerant public-key cryptography","year":"2005","key":"ref1"},{"key":"ref9","first-page":"43","volume":"38","author":"mitra","year":"2005","journal-title":"Robust System Design with Built-in Soft-error Resilience Computer"}],"event":{"name":"Test Symposium (EWDTS)","start":{"date-parts":[[2010,9,17]]},"location":"St. Petersburg, Russia","end":{"date-parts":[[2010,9,20]]}},"container-title":["2010 East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5738234\/5742029\/05742055.pdf?arnumber=5742055","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,21]],"date-time":"2021-11-21T08:15:44Z","timestamp":1637482544000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5742055\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2010.5742055","relation":{},"subject":[],"published":{"date-parts":[[2010,9]]}}}