{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T20:59:45Z","timestamp":1725569985220},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/ewdts.2010.5742069","type":"proceedings-article","created":{"date-parts":[[2011,4,7]],"date-time":"2011-04-07T16:00:27Z","timestamp":1302192027000},"page":"495-499","source":"Crossref","is-referenced-by-count":0,"title":["IEEE 1500 compliant test wrapper generation tool for VHDL models"],"prefix":"10.1109","author":[{"given":"Sergey","family":"Mikhtonyuk","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maksim","family":"Davydov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Roman","family":"Hwang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dmitry","family":"Shcherbin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"article-title":"Contributing to Eclipse: Principles, Patterns, and Plug-Ins","year":"2003","author":"gamma","key":"ref4"},{"article-title":"Compilers: Principles, Techniques and Tools","year":"2006","author":"aho","key":"ref3"},{"key":"ref6","first-page":"47","article-title":"Flex - a fast scanner generator. Edition 2.5","author":"paxson","year":"1995"},{"key":"ref5","first-page":"464","article-title":"Essential COM","author":"box","year":"1998"},{"key":"ref7","article-title":"Yacc: Yet another Compiler Compiler","author":"johnso","year":"1975","journal-title":"Computing Science Technical Report 32"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/0-387-34609-0"},{"journal-title":"Digital Object Identifier 10 1109\/IEEESTD 2005 96465","first-page":"1_","year":"2005","key":"ref1"}],"event":{"name":"Test Symposium (EWDTS)","start":{"date-parts":[[2010,9,17]]},"location":"St. Petersburg, Russia","end":{"date-parts":[[2010,9,20]]}},"container-title":["2010 East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5738234\/5742029\/05742069.pdf?arnumber=5742069","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:53:33Z","timestamp":1490079213000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5742069\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2010.5742069","relation":{},"subject":[],"published":{"date-parts":[[2010,9]]}}}