{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T04:18:26Z","timestamp":1725509906054},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/ewdts.2010.5742109","type":"proceedings-article","created":{"date-parts":[[2011,4,7]],"date-time":"2011-04-07T16:00:27Z","timestamp":1302192027000},"page":"473-478","source":"Crossref","is-referenced-by-count":0,"title":["Technology for faulty blocks coverage by spares"],"prefix":"10.1109","author":[{"given":"Hahanov","family":"Vladimir","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chumachenko","family":"Svetlana","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Litvinova","family":"Eugenia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zakharchenko","family":"Oleg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kulbakova","family":"Natalka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.41"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1198687"},{"key":"ref10","first-page":"40","article-title":"Embedded technologies of SiP components repair","author":"litvinova","year":"2008","journal-title":"Automated Control Systems and A D"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1109\/ETS.2007.10","article-title":"An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy","author":"ohler","year":"2007","journal-title":"12th IEEE European Test Symposium (ETS'07)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2003.1222363"},{"key":"ref8","first-page":"57","article-title":"Modification of the exact method for solving the problem of rectangular objects placement","author":"chub","year":"2008","journal-title":"Automated Control Systems and A D"},{"key":"ref7","first-page":"134","article-title":"Method of solving the problem of rectangles placement with variable metric characteristics","author":"novozshilova","year":"2008","journal-title":"Radioelectronic and informatics"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/54.573354"},{"key":"ref9","first-page":"266","author":"stoyan","year":"1986","journal-title":"Mathematical Models and Optimization Methods of Geometrical Designing"},{"journal-title":"Logic Vision","article-title":"Memory Repair Primer – A guide to understanding embedded memory Repair options and issues","year":"2007","key":"ref1"}],"event":{"name":"Test Symposium (EWDTS)","start":{"date-parts":[[2010,9,17]]},"location":"St. Petersburg, Russia","end":{"date-parts":[[2010,9,20]]}},"container-title":["2010 East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5738234\/5742029\/05742109.pdf?arnumber=5742109","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T22:11:29Z","timestamp":1497910289000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5742109\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2010.5742109","relation":{},"subject":[],"published":{"date-parts":[[2010,9]]}}}