{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:00:24Z","timestamp":1730221224195,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/ewdts.2011.6116424","type":"proceedings-article","created":{"date-parts":[[2012,1,6]],"date-time":"2012-01-06T14:28:21Z","timestamp":1325860101000},"page":"106-112","source":"Crossref","is-referenced-by-count":0,"title":["Efficient selective compaction and un-compaction of inconsequential logical design units in the schematic representation of a design"],"prefix":"10.1109","author":[{"given":"Tarun","family":"Kumar Goyal","sequence":"first","affiliation":[]},{"given":"Amarpal","family":"Singh","sequence":"additional","affiliation":[]},{"given":"Rahul","family":"Aggarwal","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1992.658059"},{"key":"2","article-title":"Top-down design methods bring back the useful schematic diagram","volume":"49","author":"pratt","year":"2001","journal-title":"Electronic Design"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2010.5548697"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/43.62774"},{"journal-title":"Digital Systems Testing and Testable Design","year":"1990","author":"abramovici","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1989.76962"},{"journal-title":"Automated Generation of Logic Diagrams","year":"1975","author":"smith","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/0167-9260(91)90004-5"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ASIC.1992.270287"},{"journal-title":"Digital Logic Testing and Simulation","year":"1986","author":"miczo","key":"8"}],"event":{"name":"Test Symposium (EWDTS)","start":{"date-parts":[[2011,9,9]]},"location":"Sevastopol, Ukraine","end":{"date-parts":[[2011,9,12]]}},"container-title":["2011 9th East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6107929\/6116407\/06116424.pdf?arnumber=6116424","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T13:12:58Z","timestamp":1490101978000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6116424\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2011.6116424","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}