{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:26:23Z","timestamp":1725427583057},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/ewdts.2011.6116599","type":"proceedings-article","created":{"date-parts":[[2012,1,6]],"date-time":"2012-01-06T14:28:21Z","timestamp":1325860101000},"page":"255-258","source":"Crossref","is-referenced-by-count":3,"title":["Implementation by the special formula of an arbitrary subset of code words of (m, n)-code for designing a self-testing checker"],"prefix":"10.1109","author":[{"given":"N.","family":"Butorina","sequence":"first","affiliation":[]},{"given":"S.","family":"Ostanin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675138"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223705"},{"journal-title":"Self-Checking and Fault-Tolerant Digital Design","year":"2000","author":"lala","key":"1"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/BEC.2006.311093"},{"key":"5","first-page":"124","author":"matrosova","year":"2003","journal-title":"Designing Self-testing Checker with CLBs"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2003.1214366"}],"event":{"name":"Test Symposium (EWDTS)","start":{"date-parts":[[2011,9,9]]},"location":"Sevastopol, Ukraine","end":{"date-parts":[[2011,9,12]]}},"container-title":["2011 9th East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6107929\/6116407\/06116599.pdf?arnumber=6116599","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T13:00:25Z","timestamp":1490101225000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6116599\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2011.6116599","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}