{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:57:02Z","timestamp":1729630622685,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/ewdts.2013.6673082","type":"proceedings-article","created":{"date-parts":[[2013,12,4]],"date-time":"2013-12-04T14:45:40Z","timestamp":1386168340000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["ASICPlacementAnalyzer: Software tool for data analysis and visualization of ASIC placement"],"prefix":"10.1109","author":[{"given":"Victor M.","family":"Kureichik","sequence":"first","affiliation":[]},{"given":"Maria V.","family":"Lisyak","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"International Technology Roadmap for Semiconductors","year":"0","key":"3"},{"journal-title":"Handbook of Algorithms for Physical Design Automation","year":"2009","author":"alpert","key":"2"},{"key":"1","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1007\/978-3-540-85281-0_1","article-title":"General questions of automated design and engineering","volume":"212","author":"kacprzyk","year":"2009","journal-title":"Studies in Computational Intelligence"},{"journal-title":"Placement Formats","year":"0","author":"caldwell","key":"7"},{"key":"6","first-page":"72","article-title":"Toward cad-ip reuse: The marco gsrc bookshelf of fundamental cad algorithms","author":"caldwell","year":"2002","journal-title":"IEEE Design and Test"},{"key":"5","first-page":"16","article-title":"Modelling of cad productivity","volume":"4","author":"lisyak","year":"2008","journal-title":"Proceedings of the International Scientific Conferences \ufffdIntelligent Systems\ufffd (S'08) and \ufffdIntelligent CAD\ufffd (CAD-2008)"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-85281-0"},{"year":"0","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228500"}],"event":{"name":"2013 11th East-West Design and Test Symposium (EWDTS)","start":{"date-parts":[[2013,9,27]]},"location":"Rostov-on-Don, Russia","end":{"date-parts":[[2013,9,30]]}},"container-title":["East-West Design & Test Symposium (EWDTS 2013)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6663756\/6673074\/06673082.pdf?arnumber=6673082","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T23:38:46Z","timestamp":1498088326000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6673082\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2013.6673082","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}