{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T20:25:34Z","timestamp":1725654334041},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/ewdts.2013.6673115","type":"proceedings-article","created":{"date-parts":[[2013,12,4]],"date-time":"2013-12-04T19:45:40Z","timestamp":1386186340000},"page":"1-4","source":"Crossref","is-referenced-by-count":6,"title":["Impact of process variations on read failures in SRAMs"],"prefix":"10.1109","author":[{"given":"G.","family":"Harutyunyan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Shoukourian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Vardanian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Zorian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.909792"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852295"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.56"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2001.929760"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.859565"},{"journal-title":"Advanced test Methods for SRAMs - Effective Solutions for Dynamic fault Detection in Nanoscaled Technologies","year":"2009","author":"bosio","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2007.4295256"},{"key":"4","first-page":"2541","article-title":"Subthreshold circuit design with shrinking cmos devices","author":"calhoun","year":"2009","journal-title":"IEEE International Symposium on Circuits and Systems"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2002.1029769"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1991","author":"vande goor","key":"8"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2013.6548893"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2184107"}],"event":{"name":"2013 11th East-West Design and Test Symposium (EWDTS)","start":{"date-parts":[[2013,9,27]]},"location":"Rostov-on-Don, Russia","end":{"date-parts":[[2013,9,30]]}},"container-title":["East-West Design & Test Symposium (EWDTS 2013)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6663756\/6673074\/06673115.pdf?arnumber=6673115","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T00:07:20Z","timestamp":1490227640000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6673115\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2013.6673115","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}