{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T11:18:15Z","timestamp":1725535095447},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/ewdts.2013.6673184","type":"proceedings-article","created":{"date-parts":[[2013,12,4]],"date-time":"2013-12-04T19:45:40Z","timestamp":1386186340000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Observability calculation of state variable oriented to robust PDFs and LOC or LOS techniques"],"prefix":"10.1109","author":[{"given":"A.","family":"Matrosova","sequence":"first","affiliation":[]},{"given":"S.","family":"Ostanin","sequence":"additional","affiliation":[]},{"given":"A.","family":"Melnikov","sequence":"additional","affiliation":[]},{"given":"V.","family":"Singh","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.12"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.96"},{"key":"1","first-page":"1","article-title":"Achieving high transition delay fault coverage with partial dtsff enhanced scan chains","author":"xu","year":"2007","journal-title":"Proceedings of International Test Conference"},{"key":"6","first-page":"356","article-title":"Multiple stuck-at fault and path delay fault testable circuits","author":"matrosova","year":"2008","journal-title":"Proceedings of EWDT Symposium"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2010.5742130"},{"key":"4","article-title":"Selection of the flip-flops for partial enhanced scan techniques","author":"yu","year":"2012","journal-title":"Herald of Tomsk State University Journal of Control and Computer Science"}],"event":{"name":"2013 11th East-West Design and Test Symposium (EWDTS)","start":{"date-parts":[[2013,9,27]]},"location":"Rostov-on-Don, Russia","end":{"date-parts":[[2013,9,30]]}},"container-title":["East-West Design & Test Symposium (EWDTS 2013)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6663756\/6673074\/06673184.pdf?arnumber=6673184","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T22:59:22Z","timestamp":1490223562000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6673184\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2013.6673184","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}