{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:01:09Z","timestamp":1730221269791,"version":"3.28.0"},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/ewdts.2013.6673185","type":"proceedings-article","created":{"date-parts":[[2013,12,4]],"date-time":"2013-12-04T14:45:40Z","timestamp":1386168340000},"page":"1-12","source":"Crossref","is-referenced-by-count":1,"title":["Architecture of built-in self-test and recovery memory chips"],"prefix":"10.1109","author":[{"given":"V.A.","family":"Andrienko","sequence":"first","affiliation":[]},{"given":"Moamar","family":"Diaa","sequence":"additional","affiliation":[]},{"given":"V.G.","family":"Ryabtsev","sequence":"additional","affiliation":[]},{"given":"T.Yu.","family":"Utkina","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"327","article-title":"A built-in self-repair scheme for random access memories with 2-d redundancy","volume":"1","author":"bala souri","year":"2011","journal-title":"International Journal of Soft Computing and Engineerin (IJSCE) Num 5"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1198687"},{"journal-title":"Semiconductor Integrated Circuit and Method for Testing Memory","year":"2001","key":"1"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2010.5742062"},{"key":"4","first-page":"74","article-title":"Infrastructure service soc","author":"hahanov","year":"2008","journal-title":"Bulletin of Tomsk University"}],"event":{"name":"2013 11th East-West Design and Test Symposium (EWDTS)","start":{"date-parts":[[2013,9,27]]},"location":"Rostov-on-Don, Russia","end":{"date-parts":[[2013,9,30]]}},"container-title":["East-West Design & Test Symposium (EWDTS 2013)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6663756\/6673074\/06673185.pdf?arnumber=6673185","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T18:22:16Z","timestamp":1490206936000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6673185\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2013.6673185","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}