{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:01:29Z","timestamp":1730221289281,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/ewdts.2014.7027092","type":"proceedings-article","created":{"date-parts":[[2015,2,5]],"date-time":"2015-02-05T14:24:26Z","timestamp":1423146266000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Malicious hardware: Characteristics, classification and formal models"],"prefix":"10.1109","author":[{"given":"Valeriy","family":"Gorbachov","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"3","article-title":"Trusted ics proposers day metrics discussion","author":"wilt","year":"2007","journal-title":"DARPA"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484928"},{"key":"1","article-title":"Trust in integrated circuits (tic)","author":"colins","year":"2007","journal-title":"DARPA Solicitation BAA07-24"},{"journal-title":"Detecting Hardware Trojans","year":"2009","author":"sanno","key":"7"},{"key":"6","first-page":"306","article-title":"Classification and formal models of hardware trojans, Applied Radio Electronics and Informatics","volume":"6","author":"gorbachov","year":"2007","journal-title":"Sci Journ Kharkov KhNURE"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559039"},{"journal-title":"Fundamental of Information Systems Security-M Telecom","year":"2000","author":"zegzhda","key":"4"},{"key":"8","first-page":"275","article-title":"Formal basis of malicious hardware blocking methods","volume":"11","author":"gorbachov","year":"2012","journal-title":"Applied Radio Electronics Sci Journ Kharkov KhNURE"}],"event":{"name":"2014 East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2014,9,26]]},"location":"Kiev, Ukraine","end":{"date-parts":[[2014,9,29]]}},"container-title":["Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7000956\/7027034\/07027092.pdf?arnumber=7027092","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T01:16:44Z","timestamp":1490318204000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7027092\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2014.7027092","relation":{},"subject":[],"published":{"date-parts":[[2014,9]]}}}