{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T10:17:35Z","timestamp":1773656255235,"version":"3.50.1"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/ewdts.2015.7493112","type":"proceedings-article","created":{"date-parts":[[2016,6,16]],"date-time":"2016-06-16T20:15:55Z","timestamp":1466108155000},"page":"1-8","source":"Crossref","is-referenced-by-count":10,"title":["Sum code formation with minimum total number of undetectable errors in data vectors"],"prefix":"10.1109","author":[{"given":"Dmitry","family":"Efanov","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vladimir","family":"Sapozhnikov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Valery","family":"Sapozhnikov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dmitry","family":"Nikitin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1134\/S0005117910060123"},{"key":"ref11","first-page":"17","article-title":"Formation of the Berger Modified Code with Minimum Number of Undetectable Errors of Data Bits","volume":"34","author":"blyudov","year":"2012","journal-title":"Electronic Simulation"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2013.6673133"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(61)80024-7"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766691"},{"key":"ref15","first-page":"184","article-title":"New Methods of Concurrent Checking: Edition 1","author":"goessel","year":"2008"},{"key":"ref16","first-page":"179","article-title":"Design of Self-Checking Checkers for Berger Codes","volume":"c 27","author":"marouf","year":"1978","journal-title":"Proc of 8th Annual International Conference on Fault-Tolerant Computing"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008244815697"},{"key":"ref3","first-page":"111","author":"piestrak","year":"1995","journal-title":"Design of Self-Testing Checkers for Unidirectional Error Detecting Codes"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/0471792748"},{"key":"ref5","first-page":"224","article-title":"Self-Checking Digital Devices","author":"sapozhnikov","year":"1992"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(61)80037-5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1134\/S0005117913070084"},{"key":"ref2","first-page":"216","author":"lala","year":"2001","journal-title":"Self-Checking and Fault-Tolerant Digital Design"},{"key":"ref1","first-page":"261","author":"g\u00f6ssel","year":"1994","journal-title":"Error Detection Circuits"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(62)90223-1"}],"event":{"name":"2015 IEEE East-West Design & Test Symposium (EWDTS)","location":"Batumi, Georgia","start":{"date-parts":[[2015,9,26]]},"end":{"date-parts":[[2015,9,29]]}},"container-title":["2015 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7488713\/7493093\/07493112.pdf?arnumber=7493112","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T12:04:20Z","timestamp":1489752260000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7493112\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2015.7493112","relation":{},"subject":[],"published":{"date-parts":[[2015,9]]}}}