{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T10:19:22Z","timestamp":1773656362016,"version":"3.50.1"},"reference-count":31,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/ewdts.2015.7493133","type":"proceedings-article","created":{"date-parts":[[2016,6,17]],"date-time":"2016-06-17T00:15:55Z","timestamp":1466122555000},"page":"1-7","source":"Crossref","is-referenced-by-count":15,"title":["Modular sum codes in building testable discrete systems"],"prefix":"10.1109","author":[{"given":"Valery","family":"Sapozhnikov","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vladimir","family":"Sapozhnikov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dmitry","family":"Efanov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","year":"0","journal-title":"Benchmarks LGSynth89"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2014.7027056"},{"key":"ref10","first-page":"144","article-title":"Compact and High Speed Berger Code Checker","author":"metra","year":"1996","journal-title":"Proc of the 2nd IEEE Int On-Line Testing Workshop"},{"key":"ref11","first-page":"354","article-title":"Modular TSC Checkers for Bose-Lin and Bose Codes","author":"nikolos","year":"1999","journal-title":"Proc of the IEEE VLSI Test Symposium"},{"key":"ref12","first-page":"172","article-title":"Novel TSC Checkers for Bose-Lin and Bose Codes","author":"kavousianos","year":"1998","journal-title":"Proc of the 3ed IEEE International On-Line Testing Workshop"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008344603814"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894311"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2001.915234"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.80"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5196001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9260(99)00013-9"},{"key":"ref19","first-page":"1551","article-title":"Self-Checking Computing Devices and Systems (Re-view)","volume":"42","author":"slabakov","year":"1981","journal-title":"Automation and Remote Control"},{"key":"ref28","first-page":"395","article-title":"Survivable Self-Checking Sequential Circuits","author":"matrosova","year":"2001","journal-title":"Proc of 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2001)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008244815697"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1155\/1998\/20389"},{"key":"ref3","first-page":"614","article-title":"Objects and Methods of On-Line Testing for Safe Instrumentation and Control Systems","author":"drozd","year":"2012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1134\/S0005117910060123"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.17586\/0021-3454-2015-58-5-333-343"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2000.856633"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.125100"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/43.62799"},{"key":"ref2","first-page":"111","article-title":"Design of Self-Testing Checkers for Unidirectional Error Detecting Codes","author":"piestrak","year":"1995"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-2309-3"},{"key":"ref1","first-page":"208","article-title":"Self-Checking Devices and Fault-Tolerant Systems","author":"sogomonyan","year":"1989"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"1026","DOI":"10.1109\/TC.1985.1676535","article-title":"Systematic Unidirectional Error-Detection Codes","volume":"c 34","author":"bose","year":"1985","journal-title":"Proceedings of the IEEE Transactions on Computer"},{"key":"ref22","first-page":"17","article-title":"Formation of the Berger Modified Code with Minimum Number of Undetectable Errors of Informational Bits","volume":"34","author":"blyudov","year":"2012","journal-title":"Electronic Modeling"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(61)80037-5"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1134\/S0005117913060118"},{"key":"ref23","first-page":"114","article-title":"Properties of Code with Summation for Logical Circuit Test Organization","author":"blyudov","year":"2012","journal-title":"10th IEEE East-West Design & Test Symposium (EWDTS'12)"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1134\/S0005117914080098"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2013.6673133"}],"event":{"name":"2015 IEEE East-West Design & Test Symposium (EWDTS)","location":"Batumi, Georgia","start":{"date-parts":[[2015,9,26]]},"end":{"date-parts":[[2015,9,29]]}},"container-title":["2015 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7488713\/7493093\/07493133.pdf?arnumber=7493133","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T16:31:45Z","timestamp":1498321905000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7493133\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2015.7493133","relation":{},"subject":[],"published":{"date-parts":[[2015,9]]}}}