{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T05:56:38Z","timestamp":1775454998886,"version":"3.50.1"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/ewdts.2015.7493158","type":"proceedings-article","created":{"date-parts":[[2016,6,16]],"date-time":"2016-06-16T20:15:55Z","timestamp":1466108155000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["Quality improvement of analog circuits fault diagnosis based on ANN using clusterization as preprocessing"],"prefix":"10.1109","author":[{"given":"Sergey","family":"Mosin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","first-page":"278","DOI":"10.1109\/TEST.2001.966643","article-title":"Making cost effective low resolution fault dictionaries","author":"lavo","year":"2001","journal-title":"ITC International Test Conference"},{"key":"ref3","first-page":"307","article-title":"Analog linear circuits diagnosis using fault dictionary approach","author":"lantsov","year":"2000","journal-title":"Proc of 7th Biennial Baltic Electronics Conf"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMM.380-384.828"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/82.558453"},{"key":"ref11","first-page":"269","article-title":"Extraction of Essential Characteristics of Analog Circuits' Output Responses Required for Signature Analysis","author":"mosin","year":"2005","journal-title":"Proceedings of IEEE East-West Design & Test Workshop Sochi"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.907947"},{"key":"ref12","first-page":"281","article-title":"Some methods for classification and analysis of multivariate observations","volume":"1","author":"macqueen","year":"1967","journal-title":"Proc of the Fifth Berkeley Symposium on Mathematical Statistics and Probability"},{"key":"ref8","first-page":"51","article-title":"Neural network-based detection of catastrophic defects in analog IC using wavelet decomposition","author":"stopjakova","year":"2004","journal-title":"Proc IEEE Work Design and Diagnostics of Electronic Circuits and Systems"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/82.823545"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"198","DOI":"10.1109\/81.557362","article-title":"Robust fault diagnosis for large scale analog circuits with measurement noises","volume":"44","author":"she","year":"1997","journal-title":"IEEE Transactions On Circuits And Systems-I Fundamental Theory And Applications"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2025068"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/82.486460"}],"event":{"name":"2015 IEEE East-West Design & Test Symposium (EWDTS)","location":"Batumi, Georgia","start":{"date-parts":[[2015,9,26]]},"end":{"date-parts":[[2015,9,29]]}},"container-title":["2015 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7488713\/7493093\/07493158.pdf?arnumber=7493158","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T12:31:45Z","timestamp":1498307505000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7493158\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2015.7493158","relation":{},"subject":[],"published":{"date-parts":[[2015,9]]}}}