{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T23:43:35Z","timestamp":1729640615155,"version":"3.28.0"},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/ewdts.2016.7807635","type":"proceedings-article","created":{"date-parts":[[2017,1,9]],"date-time":"2017-01-09T21:42:59Z","timestamp":1483998179000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Universal mitigation of NBTI-induced aging by design randomization"],"prefix":"10.1109","author":[{"given":"Maksim","family":"Jenihhin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexander","family":"Kamkin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zainalabedin","family":"Navabi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Somayeh","family":"Sadeghi-Kohan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2013.2267274"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"370","DOI":"10.1145\/1278480.1278574","article-title":"nbti-aware synthesis of digital circuits","author":"kumar","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810264"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.11"},{"key":"ref14","first-page":"399","article-title":"NBTI tolerant microarchitecture design in the presence of process variation","author":"fu","year":"2008","journal-title":"Proceedings of International Symposium on Microarchitecture"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2015.7127368"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116290"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MicroCom.2016.7522418"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2016.57"},{"year":"0","key":"ref19"},{"key":"ref28","article-title":"Optimistic Clock Adjustment for Preventiung Better Than Worst Case Violations","author":"hashemi","year":"2016","journal-title":"VLSI-SOC 2016"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2015.13"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2009.4796494"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2289874"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2007.4430895"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910130"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320885"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.876041"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-016-5589-x"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.040"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"317","DOI":"10.1007\/3-540-61996-8_49","article-title":"Tamper resistant software: an implementation","volume":"1174","author":"aucsmith","year":"1996","journal-title":"Information Hiding LNCS"},{"journal-title":"LLVM compiler infrastructure web page","year":"0","key":"ref22"},{"year":"0","key":"ref21"},{"year":"0","key":"ref24"},{"key":"ref23","article-title":"The nML machine description formalism","author":"freericks","year":"1993","journal-title":"Technical Report TR SM-IMP\/DIST\/08 TU Berlin CS Department"},{"journal-title":"Revision 6 03 MIPS Technologies Inc","article-title":"MIPS64 architecture for programmers","year":"2015","key":"ref26"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176465"}],"event":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2016,10,14]]},"location":"Yerevan, Armenia","end":{"date-parts":[[2016,10,17]]}},"container-title":["2016 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794989\/7807620\/07807635.pdf?arnumber=7807635","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,17]],"date-time":"2019-09-17T09:37:29Z","timestamp":1568713049000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7807635\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2016.7807635","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}