{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:02:08Z","timestamp":1730221328443,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/ewdts.2016.7807676","type":"proceedings-article","created":{"date-parts":[[2017,1,9]],"date-time":"2017-01-09T16:42:59Z","timestamp":1483980179000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["A fault-tolerant sequential circuit design for soft errors based on fault-secure circuit"],"prefix":"10.1109","author":[{"given":"S.","family":"Ostanin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Matrosova","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Butorina","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Lavrov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2015.7493129"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2002.1030177"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2011.6116599"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2016.7604658"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2013.6673133"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2015.7493130"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2010.5742130"},{"key":"ref8","first-page":"162","article-title":"Self-Checking Synchronous FSM network Design","author":"yu","year":"1998","journal-title":"On-Line Testing Workshop (IOLTW)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/BF00971960"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/12.663771"},{"key":"ref9","first-page":"47","article-title":"Self-checking synchronous FSM network design with low overhead","volume":"11 ? 1","author":"a","year":"2000","journal-title":"VLSI Design"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2001.966793"}],"event":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2016,10,14]]},"location":"Yerevan, Armenia","end":{"date-parts":[[2016,10,17]]}},"container-title":["2016 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794989\/7807620\/07807676.pdf?arnumber=7807676","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,21]],"date-time":"2017-01-21T00:14:03Z","timestamp":1484957643000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7807676\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2016.7807676","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}