{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:02:07Z","timestamp":1730221327831,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/ewdts.2016.7807677","type":"proceedings-article","created":{"date-parts":[[2017,1,9]],"date-time":"2017-01-09T16:42:59Z","timestamp":1483980179000},"page":"1-8","source":"Crossref","is-referenced-by-count":7,"title":["Concurrent error detection of combinational circuits by the method of boolean complement on the base of \u00ab2-out-of-4\u00bb code"],"prefix":"10.1109","author":[{"given":"Valery","family":"Sapozhnikov","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vladimir","family":"Sapozhnikov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dmitry","family":"Efanov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894311"},{"key":"ref11","first-page":"83","article-title":"Design of Totally Self-Checking Combinational Circuits by Use of Complementary Circuits","author":"sapozhnikov","year":"2004","journal-title":"Proceedings of East-West De- sign & Test Workshop"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10513-005-0174-2"},{"article-title":"An Optimized Concurrent Self-Checker Using Constraint-Don‘t Cares and 1-out-of-4 Code","year":"0","author":"sen","key":"ref13"},{"article-title":"A Self-Checking Circuit for Concurrent Checking by 1-out-of-4 code with Design Optimization using Constraint Don't Cares","year":"0","author":"sen","key":"ref14"},{"article-title":"An Optimized Concurrent Self-Checker using Constraint-Don‘t Cares and 1-out-of-4 Code","year":"0","author":"halder","key":"ref15"},{"article-title":"A Self-Checking Circuit for Concurrent Checking by 1-out-of-4 code with Design Optimization using Constraint Don't Cares","year":"0","author":"sen","key":"ref16"},{"key":"ref17","first-page":"224","article-title":"Self-Checking Discrete Devices","author":"sapozhnikov","year":"1992"},{"key":"ref18","first-page":"320","article-title":"Technical Diagnosis Fundamentals (Diagnostic Algorithm Optimization, Apparatus Means)","author":"parkhomenko","year":"1981"},{"key":"ref19","first-page":"1362","article-title":"Necessary and sufficient conditions for the design of totally checking circuits of compression by modulo 2","volume":"40","author":"aksjonova","year":"1979","journal-title":"Automation & Remote Control"},{"key":"ref4","first-page":"184","article-title":"New Methods of Concurrent Checking: Edition 1","author":"goessel","year":"2008","journal-title":"Springer Science+Business Media Dordrecht"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1023\/A:1021884727370"},{"key":"ref6","first-page":"261","article-title":"Error Detection Circuits","author":"g\u00f6ssel","year":"1994"},{"key":"ref5","first-page":"33","article-title":"Constraint Don't Cares for Optimizing Designs for Concurrent Checking by 1-out-of-3 Codes","author":"das","year":"2012","journal-title":"Proceedings of the 10 th InternationalWorkshops on Boolean Problems"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.644041"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510851"},{"key":"ref2","first-page":"52","article-title":"Organization of Functional Checking of Combinational Circuits by the Logic Complement Method","volume":"24","author":"sapozhnikov","year":"2002","journal-title":"Electronic Modeling"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2000.856627"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008244815697"}],"event":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2016,10,14]]},"location":"Yerevan, Armenia","end":{"date-parts":[[2016,10,17]]}},"container-title":["2016 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794989\/7807620\/07807677.pdf?arnumber=7807677","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,21]],"date-time":"2017-01-21T00:01:25Z","timestamp":1484956885000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7807677\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2016.7807677","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}