{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T03:50:39Z","timestamp":1725421839859},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/ewdts.2016.7807733","type":"proceedings-article","created":{"date-parts":[[2017,1,9]],"date-time":"2017-01-09T21:42:59Z","timestamp":1483998179000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["Bandpass RC filters of the second-order based on the micropower two-component differential stages"],"prefix":"10.1109","author":[{"given":"A. A.","family":"Ignashin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A. I.","family":"Serebryakov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D. V.","family":"Medvedev","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P. S.","family":"Budyakov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SIBCON.2009.5044864"},{"key":"ref11","first-page":"163","article-title":"New microcircuit of the master slice array MSA-2.1 for the design of the radiation-hardened analog and analog-digital interfaces of the sensor systems","author":"dvornikov","year":"2016","journal-title":"Radio Engineering"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1134\/S1063739716010030"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEEEGCC.2015.7060065"},{"key":"ref14","first-page":"1","article-title":"The Radiation-Hardened Instrumentation Amplifier Based on the Differential Difference Operational Amplifier for BUFET Technological Process","author":"titov","year":"0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CRMICO.2014.6959675"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2015.67"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEEEGCC.2015.7060064"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CICSyN.2014.53"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2015.7493136"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2013.6673113"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2014.7027069"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCCSP.2010.5463418"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/9781119149606"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2015.7365681"}],"event":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2016,10,14]]},"location":"Yerevan, Armenia","end":{"date-parts":[[2016,10,17]]}},"container-title":["2016 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794989\/7807620\/07807733.pdf?arnumber=7807733","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,21]],"date-time":"2017-01-21T05:10:24Z","timestamp":1484975424000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7807733\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2016.7807733","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}