{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T05:23:13Z","timestamp":1725513793777},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/ewdts.2016.7807739","type":"proceedings-article","created":{"date-parts":[[2017,1,9]],"date-time":"2017-01-09T16:42:59Z","timestamp":1483980179000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["A quality characteristics estimation methodology for the hierarchy of RTL compilers"],"prefix":"10.1109","author":[{"given":"L.","family":"Martirosyan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/43.766722"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1198687"},{"key":"ref6","first-page":"485","article-title":"An Approach for Quick Area Estimation of Compiler Generated RTL","author":"ter-galstyan","year":"0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SECON.2015.7132972"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CSITechnol.2013.6710329"},{"key":"ref7","first-page":"287","article-title":"A quick area estimation method for RTL compilers","author":"martirosyan","year":"0"},{"key":"ref2","first-page":"461","article-title":"Rebust Solution for Embedded Memory Test and Repair","author":"darinyan","year":"0"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2009.1041"}],"event":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2016,10,14]]},"location":"Yerevan, Armenia","end":{"date-parts":[[2016,10,17]]}},"container-title":["2016 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794989\/7807620\/07807739.pdf?arnumber=7807739","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,20]],"date-time":"2017-01-20T23:48:15Z","timestamp":1484956095000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7807739\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2016.7807739","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}