{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,28]],"date-time":"2026-06-28T05:06:21Z","timestamp":1782623181755,"version":"3.54.5"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/ewdts.2016.7807750","type":"proceedings-article","created":{"date-parts":[[2017,1,9]],"date-time":"2017-01-09T16:42:59Z","timestamp":1483980179000},"page":"1-5","source":"Crossref","is-referenced-by-count":16,"title":["Objects and methods of on-line testing: Main requirements and perspectives of development"],"prefix":"10.1109","author":[{"given":"A.","family":"Drozd","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J.","family":"Drozd","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"S.","family":"Antoshchuk","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"V.","family":"Nikul","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"M.","family":"Al-dhabi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.61"},{"key":"ref11","first-page":"205","article-title":"Fuzzy models for capacitative vehicle routing problems in uncertainty","author":"kondratenko","year":"2006","journal-title":"Proc of 4th Int DAAAM Symposium"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2014.7027104"},{"key":"ref13","first-page":"698","author":"tanenbaum","year":"1999","journal-title":"Structured Computer Organization"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2015.7493122"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/103162.103163"},{"key":"ref16","year":"2008","journal-title":"IEEE Standard for Floating-Point Arithmetic IEEE 3 Park Avenue"},{"key":"ref17","author":"melnik","year":"2008","journal-title":"Architecture of Computer"},{"key":"ref18","first-page":"472","author":"yastrebenetsky","year":"2007","journal-title":"NPP I&Cs Problems of Safety"},{"key":"ref19","year":"2010","journal-title":"Functional Safety of Electrical \/ Electronic \/ Programmable Electronic Safety Related Systems ? Part 1 General requirements"},{"key":"ref4","first-page":"224","author":"guk","year":"1997","journal-title":"Processors Intel From 8086 to Pentium II"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IDAACS.2013.6662656"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223705"},{"key":"ref5","article-title":"Compute Unified Device Architecture. Programming Guide","volume":"113","year":"2007","journal-title":"NVIDIA Corporation version 1"},{"key":"ref8","first-page":"33","article-title":"Comparison between the basic LSB Replacement Technique & Increased Capacity of Information Hiding in LSB's Method for Images","volume":"45","author":"kekre","year":"2012","journal-title":"International Journal of Computer Applications"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998364"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DT.2013.6566307"},{"key":"ref9","first-page":"111","article-title":"On-line testing method for increasing a reliability of the result checking","author":"drozd","year":"2007","journal-title":"Proc East-West Design & Test Conf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-6069-9_1"},{"key":"ref20","article-title":"FPGA-based NPP I&C Systems: Development and Safety Assessment, RPC Radiy, National Aerospace University “KhAI","author":"kharchenko","year":"2008","journal-title":"SSTC on Nuclear and Radiation Safety"},{"key":"ref22","article-title":"The Apocalypses that Might Have Been","author":"gillis","year":"0"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DT.2014.6868692"},{"key":"ref24","article-title":"Digital Systems Testing and Testable Design","author":"abramovici","year":"1990"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IDAACS.2015.7341410"},{"key":"ref25","author":"belous","year":"1992","journal-title":"Microprocessor set of the large-scale integrated circuit of the K1815 series for digital signal processing The reference manual"}],"event":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","location":"Yerevan, Armenia","start":{"date-parts":[[2016,10,14]]},"end":{"date-parts":[[2016,10,17]]}},"container-title":["2016 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794989\/7807620\/07807750.pdf?arnumber=7807750","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T14:51:40Z","timestamp":1513176700000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7807750\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2016.7807750","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}