{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T17:25:28Z","timestamp":1725384328273},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/ewdts.2017.8110063","type":"proceedings-article","created":{"date-parts":[[2017,11,16]],"date-time":"2017-11-16T21:50:47Z","timestamp":1510869047000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Achieving full functional coverage for the forwarding unit of pipelined processors"],"prefix":"10.1109","author":[{"given":"V S","family":"Vineesh","sequence":"first","affiliation":[]},{"given":"Nihar","family":"Hage","sequence":"additional","affiliation":[]},{"given":"B","family":"Karthik","sequence":"additional","affiliation":[]},{"given":"Virendra","family":"Singh","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583987"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.886412"},{"key":"ref10","first-page":"548","article-title":"A scalable software-based self-test methodology for programmable processors","author":"li","year":"2003","journal-title":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2013.10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.15"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675602"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041810"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639687"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2013.6864058"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.893650"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.913755"}],"event":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2017,9,29]]},"location":"Novi Sad","end":{"date-parts":[[2017,10,2]]}},"container-title":["2017 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8101050\/8110026\/08110063.pdf?arnumber=8110063","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,18]],"date-time":"2017-12-18T23:05:14Z","timestamp":1513638314000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8110063\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2017.8110063","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}