{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T19:32:26Z","timestamp":1725391946022},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/ewdts.2017.8110074","type":"proceedings-article","created":{"date-parts":[[2017,11,16]],"date-time":"2017-11-16T16:50:47Z","timestamp":1510851047000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["An efficient testing methodology for embedded flash memories"],"prefix":"10.1109","author":[{"given":"S.","family":"Martirosyan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Harutyunyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Shoukourian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Zorian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2013.190"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.811702"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.19"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1991","author":"van de goor","key":"ref6"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1964144.1964146"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2010.5742060"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISDRS.2011.6135356"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.885828"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/5.622505"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011153"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/5.220908"}],"event":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2017,9,29]]},"location":"Novi Sad","end":{"date-parts":[[2017,10,2]]}},"container-title":["2017 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8101050\/8110026\/08110074.pdf?arnumber=8110074","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,18]],"date-time":"2017-12-18T18:04:44Z","timestamp":1513620284000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8110074\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2017.8110074","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}