{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T14:34:49Z","timestamp":1775054089445,"version":"3.50.1"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/ewdts.2017.8110091","type":"proceedings-article","created":{"date-parts":[[2017,11,16]],"date-time":"2017-11-16T21:50:47Z","timestamp":1510869047000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["Decreasing the complexity of deriving test suites against nondeterministic finite state machines"],"prefix":"10.1109","author":[{"given":"Husnu","family":"Yenigun","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Natalia","family":"Kushik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jorge","family":"Lopez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nina","family":"Yevtushenko","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ana R.","family":"Cavalli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s10009-014-0357-7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/225058.225161"},{"key":"ref6","article-title":"RFC 959 - File Transfer Protocol specification","author":"postel","year":"1985","journal-title":"IETF Internet Request for Comments"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/QUATIC.2014.38"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2010.07.001"},{"key":"ref1","author":"mathur","year":"2008","journal-title":"Foundations of Software Testing"}],"event":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","location":"Novi Sad","start":{"date-parts":[[2017,9,29]]},"end":{"date-parts":[[2017,10,2]]}},"container-title":["2017 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8101050\/8110026\/08110091.pdf?arnumber=8110091","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,18]],"date-time":"2017-12-18T23:06:01Z","timestamp":1513638361000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8110091\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2017.8110091","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}