{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T08:00:42Z","timestamp":1725696042689},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/ewdts.2018.8524626","type":"proceedings-article","created":{"date-parts":[[2018,11,8]],"date-time":"2018-11-08T18:21:03Z","timestamp":1541701263000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["Process Variation Detection and Self-Calibration Method for High-Speed Serial Links"],"prefix":"10.1109","author":[{"given":"Vazgen Sh.","family":"Melikyan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arman S.","family":"Trdatyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Armen A.","family":"Martirosyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Karen T.","family":"Khachikyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arthur S.","family":"Sahakyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arman S.","family":"Petrosyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zaven M.","family":"Avetisyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manvel T.","family":"Grigoryan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"2017","journal-title":"Hspice Reference Manual","first-page":"846","key":"ref4"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1002\/9780470891179"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/ECTC.2012.6248821"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/4.881204"}],"event":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2018,9,14]]},"location":"Kazan","end":{"date-parts":[[2018,9,17]]}},"container-title":["2018 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8502702\/8524135\/08524626.pdf?arnumber=8524626","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,2,2]],"date-time":"2020-02-02T07:04:07Z","timestamp":1580627047000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8524626\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2018.8524626","relation":{},"subject":[],"published":{"date-parts":[[2018,9]]}}}