{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:04:07Z","timestamp":1730221447048,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/ewdts.2018.8524673","type":"proceedings-article","created":{"date-parts":[[2018,11,8]],"date-time":"2018-11-08T23:21:03Z","timestamp":1541719263000},"page":"1-11","source":"Crossref","is-referenced-by-count":2,"title":["A Journey from STIL to Verilog"],"prefix":"10.1109","author":[{"given":"Slimane","family":"Boutobza","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sorin","family":"Popa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrea","family":"Costa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"volume":"1450 99","journal-title":"IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data","year":"0","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894263"},{"key":"ref6","first-page":"290","author":"maston","year":"2002","journal-title":"Considerations for STIL data application"},{"volume":"1450 1","journal-title":"IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data","year":"0","key":"ref5"},{"key":"ref8","first-page":"41.2","author":"maston","year":"2005","journal-title":"STIL Persistence"},{"key":"ref7","first-page":"1004","volume":"97","author":"maston","year":"0","journal-title":"Structuring STIL for incremental test development"},{"journal-title":"TetraMAX Test Pattern Validation User guide","year":"2018","key":"ref2"},{"volume":"1364","journal-title":"IEEE standard Verilog hardware description language - IEEE Std","year":"0","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2018.8524704"}],"event":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2018,9,14]]},"location":"Kazan","end":{"date-parts":[[2018,9,17]]}},"container-title":["2018 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8502702\/8524135\/08524673.pdf?arnumber=8524673","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T19:01:52Z","timestamp":1643223712000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8524673\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2018.8524673","relation":{},"subject":[],"published":{"date-parts":[[2018,9]]}}}