{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:04:30Z","timestamp":1730221470769,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/ewdts.2018.8524748","type":"proceedings-article","created":{"date-parts":[[2018,11,8]],"date-time":"2018-11-08T23:21:03Z","timestamp":1541719263000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Impact of Resistive Open and Bridge Defects on the SET Robustness of Standard CMOS Combinational Logic"],"prefix":"10.1109","author":[{"given":"Marko","family":"Andjelkovic","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zoran","family":"Stamenkovic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Milos","family":"Krstic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rolf","family":"Kraemer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2323216"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW.2014.7049521"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1982.4336490"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/23.903813"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2014.6841909"},{"key":"ref3","article-title":"Diagnosis of Resistive-Open and Stuck-Open Defects in Digital CMOS ICs","volume":"24","author":"li","year":"2005","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2007.70231"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2123114"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2016.146"},{"key":"ref2","article-title":"Radiation-Induced Soft Errors in Advanced Semiconductor Technologies","volume":"5","author":"baumann","year":"2003","journal-title":"IEEE Transactions on Device and Materials Reliability"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569373"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2008.4479727"}],"event":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2018,9,14]]},"location":"Kazan","end":{"date-parts":[[2018,9,17]]}},"container-title":["2018 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8502702\/8524135\/08524748.pdf?arnumber=8524748","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T21:28:29Z","timestamp":1643232509000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8524748\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2018.8524748","relation":{},"subject":[],"published":{"date-parts":[[2018,9]]}}}