{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:05:30Z","timestamp":1730221530989,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/ewdts.2019.8884423","type":"proceedings-article","created":{"date-parts":[[2019,11,5]],"date-time":"2019-11-05T06:34:05Z","timestamp":1572935645000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Making System Level Test Possible by a Mixed-mode, Multi-level, Integrated Modeling Environment"],"prefix":"10.1109","author":[{"given":"Nooshin","family":"Nosrati","sequence":"first","affiliation":[]},{"given":"Katayoon","family":"Basharkhah","sequence":"additional","affiliation":[]},{"given":"Rezgar","family":"Sadeghi","sequence":"additional","affiliation":[]},{"given":"Carna","family":"Zivkovic","sequence":"additional","affiliation":[]},{"given":"Christoph","family":"Grimm","sequence":"additional","affiliation":[]},{"given":"Zainalabedin","family":"Navabi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","volume":"17","author":"sonza reorda","year":"2006","journal-title":"System-level test and validation of hardware\/software systems"},{"key":"ref11","article-title":"Symbolic Simulation of Mixed-Signal Systems with Extended Affine Arithmetic","author":"radojicic","year":"2015","journal-title":"eda Workshop Proceedings VDE Verlag"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2019.00024"},{"key":"ref13","first-page":"1","article-title":"Semi-symbolic analysis of mixed-signal systems including discontinuities","author":"radojicic","year":"0","journal-title":"Design Automation and Test in Europe Conference and Exhibition (DATE)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-0630-0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2019.00043"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2018.8373238"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2015.7314412"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/EPTC.2014.7028421"},{"key":"ref8","article-title":"Back-annotation of Interconnect Physical Properties for System-Level Crosstalk Modeling","author":"sadeghi","year":"0","journal-title":"Test Symposium (ETS) 2019 24th IEEE European"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2016.7482550"},{"year":"0","key":"ref2"},{"year":"0","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178387"}],"event":{"name":"2019 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2019,9,13]]},"location":"Batumi, Georgia","end":{"date-parts":[[2019,9,16]]}},"container-title":["2019 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8871308\/8884369\/08884423.pdf?arnumber=8884423","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T11:25:23Z","timestamp":1658143523000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8884423\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2019.8884423","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}