{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T16:54:30Z","timestamp":1725728070627},"reference-count":3,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/ewdts.2019.8884444","type":"proceedings-article","created":{"date-parts":[[2019,11,5]],"date-time":"2019-11-05T11:34:05Z","timestamp":1572953645000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Unit Regression Test Selection According To Different Hashing Algorithms"],"prefix":"10.1109","author":[{"given":"H. Hakobyan","family":"Hovhannes","sequence":"first","affiliation":[]},{"given":"V. Vardumyan","family":"Arman","sequence":"additional","affiliation":[]},{"given":"T. Kostanyan","family":"Harutyun","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/OPTRONIX.2017.8349971"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1342211.1342229"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2008.09.010"}],"event":{"name":"2019 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2019,9,13]]},"location":"Batumi, Georgia","end":{"date-parts":[[2019,9,16]]}},"container-title":["2019 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8871308\/8884369\/08884444.pdf?arnumber=8884444","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T15:25:22Z","timestamp":1658157922000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8884444\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2019.8884444","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}