{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,28]],"date-time":"2025-08-28T12:44:51Z","timestamp":1756385091892},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/ewdts.2019.8884458","type":"proceedings-article","created":{"date-parts":[[2019,11,5]],"date-time":"2019-11-05T06:34:05Z","timestamp":1572935645000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["The Fault Tolerant CMOS Logical C-Element for Digital Devices Resistant to Single Nuclear Particles"],"prefix":"10.1109","author":[{"given":"Yuri V.","family":"Katunin","sequence":"first","affiliation":[]},{"given":"Vladimir Ya.","family":"Stenin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1134\/S1063739716050085"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/9780470891179"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-0931-2"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1134\/S1063739718010031"},{"key":"ref7","first-page":"35","author":"nicolaidis","year":"2011","journal-title":"Soft errors in modern electronic systems \/ Editor"},{"key":"ref2","first-page":"1","article-title":"Radiation-hardness of ultra-low power CMOS VLSI","author":"gambles","year":"0","journal-title":"11th NASA VLSI Design Symp"},{"key":"ref1","first-page":"204","article-title":"A theory of asynchronous circuits","author":"muller","year":"1959","journal-title":"Proc of International Symposium on the Theory of Switching"}],"event":{"name":"2019 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2019,9,13]]},"location":"Batumi, Georgia","end":{"date-parts":[[2019,9,16]]}},"container-title":["2019 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8871308\/8884369\/08884458.pdf?arnumber=8884458","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T10:45:37Z","timestamp":1658141137000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8884458\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2019.8884458","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}