{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:06:18Z","timestamp":1730221578386,"version":"3.28.0"},"reference-count":40,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,9]]},"DOI":"10.1109\/ewdts50664.2020.9225070","type":"proceedings-article","created":{"date-parts":[[2020,10,15]],"date-time":"2020-10-15T20:00:47Z","timestamp":1602792047000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["Appraisal of the Effective Number of Bits of the ADC for Sensors with Account for Dynamic Errors"],"prefix":"10.1109","author":[{"given":"Leonty","family":"Samoilov","sequence":"first","affiliation":[]},{"given":"Darya","family":"Denisenko","sequence":"additional","affiliation":[]},{"given":"Nikolay","family":"Prokopenko","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2014.6854325"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2017.2690281"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3367\/UFNr.0176.200607h.0762"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/13.61086"},{"key":"ref31","first-page":"2983","article-title":"Truncation error and aliasing error for Whittaker-Shannon sampling expansion","author":"long","year":"2011","journal-title":"Proceedings of the 30th Chinese Control Conference"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/APCC.2013.6765946"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICCA.2007.4376828"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICOSP.2000.894451"},{"key":"ref35","first-page":"762","article-title":"The use of Kotelnikov-Nyquist-Shannon sampling theorem for designing of digital control system for a power converter","volume":"49","author":"zamaruiev","year":"2006","journal-title":"2017 IEEE First Ukraine Conference on Electrical and Computer Engineering (UKRCON’2017)"},{"key":"ref34","first-page":"824","article-title":"Works on Information Theory and Cybernetics","author":"shannon","year":"1963"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1117\/12.2019737"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/BMAS.2009.5338881"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378332"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICIIECS.2015.7193116"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2008.4675087"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/81.795842"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/SSD.2009.4956708"},{"key":"ref16","article-title":"Generalized Bernstein inequality for signals with wide spectrum","volume":"4","author":"samoylov","year":"2012"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IRMMW-THz.2018.8510425"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICRESH.2010.5779611"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICIMW.2009.5325602"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/78.824688"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RFIT.2011.6141791"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/82.718806"},{"key":"ref3","first-page":"264","article-title":"Input-output of analog signals in control and monitor systems","author":"samoilov","year":"2015"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ECTICon.2017.8096303"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISMVL.2007.48"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RTEICT.2016.7807833"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3103\/S014641161502008X"},{"key":"ref7","first-page":"1","article-title":"A Shared-MSB delay-line-based ADC with simultaneous quantization for digital control single-inductor-multiple-output DC-DC converter","author":"chen","year":"2016","journal-title":"2016 IEEE International Symposium on Integrated Circuits (ISIC’2016)"},{"key":"ref2","first-page":"40","article-title":"Classical Method of The Account of Influence Time Delays of Signals in Devices of Control Systems","author":"samoilov","year":"2016","journal-title":"Izvestiya SFedU Engineering Sciences SFedU"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICICIP.2015.7388169"},{"key":"ref1","first-page":"455","article-title":"Fundamentals of informing-measurement technique","author":"ornatsky","year":"1983"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2016.7471967"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1093\/imanum\/drn088"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/YAC.2017.7967488"},{"key":"ref24","first-page":"24","article-title":"Programmable analog ICs Anadigm: structures and principles of construction","author":"polishchuk","year":"0"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/PLASMA.1993.593064"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1977.10771"},{"key":"ref25","first-page":"608","article-title":"Precision data collection systems of the MSC12xx family of Texas Instruments: architecture, programming, application development","author":"redkin","year":"2006"}],"event":{"name":"2020 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2020,9,4]]},"location":"Varna, Bulgaria","end":{"date-parts":[[2020,9,7]]}},"container-title":["2020 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9220087\/9224633\/09225070.pdf?arnumber=9225070","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:34:30Z","timestamp":1656344070000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9225070\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/ewdts50664.2020.9225070","relation":{},"subject":[],"published":{"date-parts":[[2020,9]]}}}