{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T13:28:33Z","timestamp":1725802113159},"reference-count":42,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,9]]},"DOI":"10.1109\/ewdts50664.2020.9225138","type":"proceedings-article","created":{"date-parts":[[2020,10,15]],"date-time":"2020-10-15T20:00:47Z","timestamp":1602792047000},"page":"1-8","source":"Crossref","is-referenced-by-count":5,"title":["A Review of Particle Detectors for Space-Borne Self-Adaptive Fault-Tolerant Systems"],"prefix":"10.1109","author":[{"given":"Marko","family":"Andjelkovic","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Junchao","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aleksandar","family":"Simevski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zoran","family":"Stamenkovic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Milos","family":"Krstic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rolf","family":"Kraemer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/AHS.2014.6880182"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.12.022"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2016.8093162"},{"key":"ref32","article-title":"Re-usable 180 nm CMOS Dosimeter Based on Floating Gate Transistor","author":"pikhay","year":"2016","journal-title":"Proc IEEE Int Conf Electronics Circuits Syst (ICECS)"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2955776"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2665439"},{"key":"ref37","article-title":"Monitoring of Particle Flux and LET with the Pulse Stretching Inverters","author":"andjelkovic","year":"2020","journal-title":"Proc Radiation Effects Components Syst Conf (RADECS)"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS46596.2019.8964644"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2019.00080"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/23.903813"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2008.01.002"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2011.5783060"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5538-0"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2017.11.006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2020.2975923"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5364-1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.151"},{"key":"ref16","article-title":"Cosmic Ray Detectors for Integrated Circuit Chips","author":"hannah","year":"2007","journal-title":"US Patent"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2419652"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.radmeas.2019.106230"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/1748-0221\/13\/06\/C06004"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2885693"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS50870.2020.9159716"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2521485"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861093"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5367-y"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(98)00633-0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2018.8474178"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.54"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2392616.2392619"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2047907"},{"key":"ref9","article-title":"Evaluating Fault Coverage of Bulk Built-in Current Sensor for Soft Errors in Combinational and Sequential Logic","author":"neto","year":"2005","journal-title":"Proc Symp Integrated Circuits and Systems Design (SBCCI)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2016.8093159"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/23.340587"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2009.02.004"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2018.09.109"},{"key":"ref42","doi-asserted-by":"crossref","DOI":"10.1109\/DFT50435.2020.9250856","article-title":"Hardware Accelerator Design with Supervised Machine Learning for Solar Particle Event Prediction","author":"chen","year":"2020","journal-title":"Proc IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2299733"},{"key":"ref41","doi-asserted-by":"crossref","DOI":"10.1016\/j.microrel.2020.113799","article-title":"Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning","author":"chen","year":"2020","journal-title":"Microelectronics Reliability"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2005.4365561"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2015.09.049"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IWASI.2015.7184968"}],"event":{"name":"2020 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2020,9,4]]},"location":"Varna, Bulgaria","end":{"date-parts":[[2020,9,7]]}},"container-title":["2020 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9220087\/9224633\/09225138.pdf?arnumber=9225138","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,23]],"date-time":"2022-11-23T13:43:36Z","timestamp":1669211016000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9225138\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9]]},"references-count":42,"URL":"https:\/\/doi.org\/10.1109\/ewdts50664.2020.9225138","relation":{},"subject":[],"published":{"date-parts":[[2020,9]]}}}