{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:06:40Z","timestamp":1730221600033,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,9,10]]},"DOI":"10.1109\/ewdts52692.2021.9581004","type":"proceedings-article","created":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T21:13:28Z","timestamp":1635282808000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["SAT Solvers Application of Deriving All Test Pairs Detecting Robust Testable PDFs"],"prefix":"10.1109","author":[{"given":"A.Yu.","family":"Matrosova","sequence":"first","affiliation":[]},{"given":"V.V.","family":"Andreeva","sequence":"additional","affiliation":[]},{"given":"V.Z.","family":"Tychinskiy","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/ETS.2009.36"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/ICECS.2005.4633432"},{"key":"ref6","first-page":"478","article-title":"Efficient don’t-care filling method to achieve reduction in test power","author":"sinduja","year":"2015","journal-title":"ICACCCT"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/DDECS.2010.5491750"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/PGEC.1966.264376"},{"key":"ref7","first-page":"234","article-title":"(On the Complexity of Derivation in Propositional Calculus)","volume":"8","author":"tseitin","year":"1968","journal-title":"Zapiski nauchnyh seminarov LOMI AN SSSR"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/ASPDAC.2002.994890"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1007\/s11182-018-1488-1"},{"key":"ref1","first-page":"615","article-title":"Low power optimization technique for BDD mapped circuits","author":"lindgren","year":"0","journal-title":"ASP-DAC 2001"}],"event":{"name":"2021 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2021,9,10]]},"location":"Batumi, Georgia","end":{"date-parts":[[2021,9,13]]}},"container-title":["2021 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9580973\/9580974\/09581004.pdf?arnumber=9581004","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:55:57Z","timestamp":1652201757000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9581004\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,10]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ewdts52692.2021.9581004","relation":{},"subject":[],"published":{"date-parts":[[2021,9,10]]}}}