{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T06:38:32Z","timestamp":1774420712155,"version":"3.50.1"},"reference-count":37,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,9,10]]},"DOI":"10.1109\/ewdts52692.2021.9581036","type":"proceedings-article","created":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T21:13:28Z","timestamp":1635282808000},"page":"1-11","source":"Crossref","is-referenced-by-count":8,"title":["Specifics of Error Detection with Modular Sum Codes in Concurrent Error-Detection Circuits Based on Boolean Complement Method"],"prefix":"10.1109","author":[{"given":"Dmitry","family":"Efanov","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"German","family":"Osadchy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marina","family":"Zueva","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(61)80037-5"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3103\/S0146411620020042"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3103\/S014641161906004X"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510852"},{"key":"ref37","year":"0","journal-title":"Collection of Digital Design Benchmarks"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.3103\/S0146411620040045"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS50664.2020.9224826"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2000.856626"},{"key":"ref10","first-page":"111","author":"piestrak","year":"1995","journal-title":"Design of Self-Testing Checkers for Unidirectional Error Detecting Codes"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1155\/1998\/20389"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2000.856633"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1155\/2000\/46578"},{"key":"ref14","first-page":"696","article-title":"Self-Checking Synchronous FSM Network Design for Path Delay Faults","author":"ostanin","year":"2017","journal-title":"Proceedings of 15th IEEE East-West Design & Test Symposium (EWDTS’2017)"},{"key":"ref15","first-page":"25","article-title":"Experimental Study on Hamming and Hsiao Codes in the Context of Embedded Applications","author":"tshagharyan","year":"2017","journal-title":"Proceedings of 15th IEEE East-West Design & Test Symposium (EWDTS’2017)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2017.06.015"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/EIConRus.2018.8317365"},{"key":"ref18","first-page":"365","article-title":"Generalized Algorithm of Building Summation Codes for the Tasks of Technical Diagnostics of Discrete Systems","author":"efanov","year":"2017","journal-title":"Proceedings of 15th IEEE East-West Design & Test Symposium (EWDTS’2017)"},{"key":"ref19","first-page":"383","author":"sapozhnikov","year":"2020","journal-title":"Sum Codes for Technical Diagnostics Systems Volume 1 Classical Berger Codes and Their Modifications"},{"key":"ref28","first-page":"33","article-title":"Constraint Don’t Cares for Optimizing Designs for Concurrent Checking by 1-out-of-3 Codes","author":"das","year":"2012","journal-title":"Proceedings of the 10th International Workshops on Boolean Problems"},{"key":"ref4","first-page":"436","article-title":"Principles of Modern Digital Design","author":"lala","year":"2007","journal-title":"John Wiley & Sons New Jersey"},{"key":"ref27","first-page":"184","author":"goessel","year":"2008","journal-title":"New Methods of Concurrent Checking Edition 1"},{"key":"ref3","first-page":"560","author":"pradhan","year":"1996","journal-title":"Fault-Tolerant Computer System Design"},{"key":"ref6","first-page":"252","author":"berezyuk","year":"1978","journal-title":"Information Encoding (Binary Codes)"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2019.8884398"},{"key":"ref5","first-page":"208","article-title":"Self-Checking Devices and Fault-Tolerant Systems","author":"sogomonyan","year":"1989","journal-title":"Moscow Radio & communication"},{"key":"ref8","first-page":"1362","article-title":"Necessary and Sufficient Conditions for the Design of Totally Checking Circuits of Compression by Modulo 2","volume":"40","author":"aksyonova","year":"1979","journal-title":"Automation & Remote Control"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"985","DOI":"10.1109\/TEST.2000.894311","article-title":"Which Concurrent Error Detection Scheme to Choose?","author":"mitra","year":"2000","journal-title":"Proc 2000 Intl Test Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/0471792748"},{"key":"ref9","first-page":"1512","article-title":"Design of Completely Self-Checking Combinational Devices with the Use of Residual Codes","volume":"40","author":"slabakov","year":"1979","journal-title":"Automation and Remote Control"},{"key":"ref1","first-page":"549","author":"mccluskey","year":"1986","journal-title":"Logic Design Principles with Emphasis on Testable Semicustom Circuits"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2015.7493133"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766691"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1134\/S0005117915100112"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9260(98)00028-5"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2017.8110123"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s10513-005-0174-2"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1023\/A:1021884727370"}],"event":{"name":"2021 IEEE East-West Design & Test Symposium (EWDTS)","location":"Batumi, Georgia","start":{"date-parts":[[2021,9,10]]},"end":{"date-parts":[[2021,9,13]]}},"container-title":["2021 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9580973\/9580974\/09581036.pdf?arnumber=9581036","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:55:57Z","timestamp":1652201757000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9581036\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,10]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/ewdts52692.2021.9581036","relation":{},"subject":[],"published":{"date-parts":[[2021,9,10]]}}}