{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:06:50Z","timestamp":1730221610190,"version":"3.28.0"},"reference-count":36,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,9,10]]},"DOI":"10.1109\/ewdts52692.2021.9581037","type":"proceedings-article","created":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T21:13:28Z","timestamp":1635282808000},"page":"1-10","source":"Crossref","is-referenced-by-count":0,"title":["The Structures of the Fault-Tolerant Automation and Computing Devices Based on the Boolean Complement"],"prefix":"10.1109","author":[{"given":"Valery","family":"Sapozhnikov","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vladimir","family":"Sapozhnikov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dmitry","family":"Efanov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","first-page":"142","article-title":"Hidden Fault Analysis of FPGA Projects for Critical Applications","author":"drozd","year":"2020","journal-title":"Proceedings of the IEEE International Conference on Advanced Trends in Radioelectronics Telecommunications and Computer Engineering (TCSET)"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCSET.2018.8336320"},{"key":"ref31","first-page":"328","article-title":"Sequential Circuit Design Using Synthesis and Optimization","author":"sentovich","year":"1992","journal-title":"Proceedings IEEE International Conference on Computer Design VLSI in Computers & Processors"},{"journal-title":"Collection of Digital Design Benchmarks","year":"0","key":"ref30"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2011.6116606"},{"key":"ref35","first-page":"654","article-title":"Improving of a Circuit Checkability and Trustworthiness of Data Processing Results in LUT-based FPGA Components of Safety-Related Systems","volume":"1844","author":"drozd","year":"2017","journal-title":"CEUR Workshop Proceedings"},{"key":"ref34","first-page":"30","article-title":"Development of Checkability in FPGA Components of Safety-Related Systems","volume":"2762","author":"drozd","year":"2020","journal-title":"CEUR Workshop Proceedings"},{"key":"ref10","article-title":"Fault Tolerant Fail Safe System for Railway Signalling","volume":"ii","author":"chakraborty","year":"2009","journal-title":"Proceedings of the World Congress on Engineering and Computer Science (WCECS 2009)"},{"key":"ref11","first-page":"552","author":"theeg","year":"2020","journal-title":"Railway Signalling and Interlocking"},{"key":"ref12","first-page":"224","author":"scherbakov","year":"1989","journal-title":"Reliability of Work of the Digital Devices"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s10598-017-9372-3"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/EIConRus.2018.8317365"},{"key":"ref15","first-page":"184","author":"goessel","year":"2008","journal-title":"New Methods of Concurrent Checking Edition 1"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3103\/S014641161906004X"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3103\/S0146411620020042"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS50664.2020.9224649"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.15407\/emodel.42.05.038"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.37661\/1816-0301-2020-17-2-71-85"},{"key":"ref4","first-page":"30","article-title":"Self-Correction Fault-Tolerant Systems","author":"sogomonyan","year":"2018","journal-title":"Preprint"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2019.8884398"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1023\/A:1016130108770"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/NBiS.2010.86"},{"key":"ref29","first-page":"241","author":"zakrevskij","year":"2009","journal-title":"Optimization in Boolean Space"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2008.12"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2018.07.178"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2017.8110128"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-44162-7"},{"key":"ref9","first-page":"1085","article-title":"Methods for Providing Safety in Discrete Systems","volume":"55","author":"gavzov","year":"1994","journal-title":"Automation and Remote Control"},{"key":"ref1","first-page":"216","author":"lala","year":"2001","journal-title":"Self-Checking and Fault-Tolerant Digital Design"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008244815697"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"267","DOI":"10.1007\/BF00971975","article-title":"Design of Self-Testing and On- Line Fault Detection Combinational Circuits with Weakly Independent Outputs","volume":"4","author":"sogomonyan","year":"1993","journal-title":"Journal of Electronic Testing Theory and Applications"},{"key":"ref21","first-page":"208","author":"sogomonyan","year":"1989","journal-title":"Self-Checking Devices and Fault-Tolerant Systems"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1155\/1998\/20389"},{"key":"ref23","first-page":"299","article-title":"Investigation of Combination Self-Testing Devices Having Independent and Monotone Independent Outputs","volume":"58","author":"goessel","year":"1997","journal-title":"Automation and Remote Control"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3103\/S0146411620040045"},{"key":"ref25","first-page":"1607","article-title":"Synthesis of Self-Checking Combinational Devices Based on Allocating Special Groups of Outputs","author":"efanov","year":"2018","journal-title":"Automation and Remote Control"}],"event":{"name":"2021 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2021,9,10]]},"location":"Batumi, Georgia","end":{"date-parts":[[2021,9,13]]}},"container-title":["2021 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9580973\/9580974\/09581037.pdf?arnumber=9581037","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:55:57Z","timestamp":1652201757000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9581037\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,10]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/ewdts52692.2021.9581037","relation":{},"subject":[],"published":{"date-parts":[[2021,9,10]]}}}