{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T08:00:03Z","timestamp":1725696003186},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,9,10]]},"DOI":"10.1109\/ewdts52692.2021.9581039","type":"proceedings-article","created":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T21:13:28Z","timestamp":1635282808000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["Standard Cell Library Enhancement Using Neural Network Based Sleep Mode Control Integration For Low Leakage Designs"],"prefix":"10.1109","author":[{"given":"Suren","family":"Abazyan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shavarsh","family":"Melikyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Davit","family":"Musayelyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICECA.2019.8822211"},{"key":"ref3","first-page":"1","article-title":"Power and Variation Improved Near-Vt Standard Cell Library for 28-nm FDSOI","author":"wong","year":"2019","journal-title":"2019 IEEE SOI-3D-Subthres Microelectronics Tech Unified Conf"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEMCON51383.2020.9284855"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-TSA.2019.8804628"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2019.8790931"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PRIMEASIA.2017.8280374"}],"event":{"name":"2021 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2021,9,10]]},"location":"Batumi, Georgia","end":{"date-parts":[[2021,9,13]]}},"container-title":["2021 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9580973\/9580974\/09581039.pdf?arnumber=9581039","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:55:55Z","timestamp":1652201755000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9581039\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,10]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/ewdts52692.2021.9581039","relation":{},"subject":[],"published":{"date-parts":[[2021,9,10]]}}}