{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,15]],"date-time":"2026-01-15T12:06:10Z","timestamp":1768478770990,"version":"3.49.0"},"reference-count":32,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,22]]},"DOI":"10.1109\/ewdts59469.2023.10297034","type":"proceedings-article","created":{"date-parts":[[2023,11,2]],"date-time":"2023-11-02T17:46:54Z","timestamp":1698947214000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Multi-Level Fault Injection Methodology Using UVM-SystemC"],"prefix":"10.1109","author":[{"given":"Ebrahim","family":"Nouri","sequence":"first","affiliation":[{"name":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran,Tehran,Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nooshin","family":"Nosrati","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran,Tehran,Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hanieh Totonchi","family":"Asl","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran,Tehran,Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mozhgan Rezaie","family":"Manavand","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran,Tehran,Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zainalabedin","family":"Navabi","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran,Tehran,Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2008.35"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2006.10"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2004.1319692"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966704"},{"key":"ref31","author":"salemi","year":"2013","journal-title":"The Uvm Primer A step-by-step introduction to the universal verification methodology"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2022.3176485"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/2.585157"},{"key":"ref10","first-page":"1v","article-title":"Fault injection methodology and tools","volume":"1","author":"song","year":"0","journal-title":"International Conference on Electronics and Optoelectronics"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS53253.2021.9505110"},{"key":"ref2","author":"avizienis","year":"2001","journal-title":"Fundamental Concepts of Dependability"},{"key":"ref1","first-page":"1","article-title":"The resilience wall: Cross-layer solution strategies","author":"mitra","year":"0","journal-title":"Proc Int Symp VLSI Technology Systems Applications (VLSI-TSA)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046210"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS.2018.8399945"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2001.966775"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DFT50435.2020.9250871"},{"key":"ref24","first-page":"1","article-title":"CLEAR: Cross-Layer Exploration for Architecting Resilience-Combining hardware and software techniques to tolerate soft errors in processor cores","author":"cheng","year":"0","journal-title":"Design Automation Conference (DAC)"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3079856.3080225"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.cosrev.2020.100349"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2018.2818735"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DSN-W50199.2020.00028"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LATS49555.2020.9093688"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2019.00025"},{"key":"ref28","year":"2018"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-7548-5"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2019.11.006"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342081"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1250662.1250719"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798242"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2010.5544285"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5555-z"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2012.09.005"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s10617-011-9082-6"}],"event":{"name":"2023 IEEE East-West Design & Test Symposium (EWDTS)","location":"Batumi, Georgia","start":{"date-parts":[[2023,9,22]]},"end":{"date-parts":[[2023,9,25]]}},"container-title":["2023 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10296971\/10297023\/10297034.pdf?arnumber=10297034","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,27]],"date-time":"2023-11-27T19:30:17Z","timestamp":1701113417000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10297034\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,22]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/ewdts59469.2023.10297034","relation":{},"subject":[],"published":{"date-parts":[[2023,9,22]]}}}