{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:06:57Z","timestamp":1730221617122,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,22]]},"DOI":"10.1109\/ewdts59469.2023.10297037","type":"proceedings-article","created":{"date-parts":[[2023,11,2]],"date-time":"2023-11-02T17:46:54Z","timestamp":1698947214000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Modeling Faults as Addresses"],"prefix":"10.1109","author":[{"given":"Vladimir","family":"Hahanov","sequence":"first","affiliation":[{"name":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ivan","family":"Hahanov","sequence":"additional","affiliation":[{"name":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anatolii","family":"Miroshnyk","sequence":"additional","affiliation":[{"name":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aleksander","family":"Shkil","sequence":"additional","affiliation":[{"name":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dariia","family":"Rakhlis","sequence":"additional","affiliation":[{"name":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Irina","family":"Hahanova","sequence":"additional","affiliation":[{"name":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556955"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2009.11"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907000"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990334"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2009.22"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1972.223542"},{"year":"0","key":"ref2"},{"journal-title":"IEEE Standard for VHDL Language Reference Manual-Redline","first-page":"1","year":"2019","key":"ref1"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2019.8697831"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2010.5488199"},{"year":"0","key":"ref19"},{"key":"ref18","first-page":"52","article-title":"The Maestro Behind Design-Software Behemoth Synopsys. CEO Aart de Geus created logical synthesis, which transformed how ICs are designed","author":"pretz","year":"2023","journal-title":"IEEE Spectrum"},{"key":"ref8","first-page":"3","volume":"45","author":"gharibi","year":"2023","journal-title":"Vector - deductive memory-based transaction for fault-as address simulation Electronic modeling"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1198687"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.15407\/emodel.45.02.016"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2019.8884919"},{"year":"0","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2022.3183872"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IMPACT55510.2022.10029072"}],"event":{"name":"2023 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2023,9,22]]},"location":"Batumi, Georgia","end":{"date-parts":[[2023,9,25]]}},"container-title":["2023 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10296971\/10297023\/10297037.pdf?arnumber=10297037","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,27]],"date-time":"2023-11-27T19:30:12Z","timestamp":1701113412000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10297037\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,22]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/ewdts59469.2023.10297037","relation":{},"subject":[],"published":{"date-parts":[[2023,9,22]]}}}