{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T15:21:54Z","timestamp":1772119314717,"version":"3.50.1"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,22]]},"DOI":"10.1109\/ewdts59469.2023.10297055","type":"proceedings-article","created":{"date-parts":[[2023,11,2]],"date-time":"2023-11-02T17:46:54Z","timestamp":1698947214000},"page":"1-4","source":"Crossref","is-referenced-by-count":9,"title":["A Test Rig for Thermal Analysis of Heat Sinks for Power Electronic Applications"],"prefix":"10.1109","author":[{"given":"Andrew","family":"Sharp","sequence":"first","affiliation":[{"name":"Wrexham University,Wrexham,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shafiul","family":"Monir","sequence":"additional","affiliation":[{"name":"Wrexham University,Wrexham,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Richard J.","family":"Day","sequence":"additional","affiliation":[{"name":"Wrexham University,Wrexham,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuriy","family":"Vagapov","sequence":"additional","affiliation":[{"name":"Wrexham University,Wrexham,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anton","family":"Dianov","sequence":"additional","affiliation":[{"name":"Daeyoung R&D Center,Yongin,South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/RTUCON48111.2019.8982255"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.csite.2022.101774"},{"key":"ref15","first-page":"1","article-title":"An experimental setup to evaluate the efficiency and cooling capability of IGBT and SiC power modules","author":"ravyts","year":"2019","journal-title":"Proc PCIM Europe 2019 Int Exhibition and Conf for Power Electronics Intelligent Motion Renewable Energy and Energy Management"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PEE.2019.8923285"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IWED48848.2020.9069568"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.applthermaleng.2021.117560"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2124436"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3049738"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICEPT.2018.8480725"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3148176"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2008.2003971"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2512923"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/INDEL55690.2022.9965507"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2565701"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/OJIES.2023.3235357"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.applthermaleng.2016.06.054"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2912387"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-021-01303-8"}],"event":{"name":"2023 IEEE East-West Design & Test Symposium (EWDTS)","location":"Batumi, Georgia","start":{"date-parts":[[2023,9,22]]},"end":{"date-parts":[[2023,9,25]]}},"container-title":["2023 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10296971\/10297023\/10297055.pdf?arnumber=10297055","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,27]],"date-time":"2023-11-27T19:30:18Z","timestamp":1701113418000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10297055\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,22]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/ewdts59469.2023.10297055","relation":{},"subject":[],"published":{"date-parts":[[2023,9,22]]}}}