{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T05:31:43Z","timestamp":1740115903623,"version":"3.37.3"},"reference-count":39,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T00:00:00Z","timestamp":1731456000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T00:00:00Z","timestamp":1731456000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,13]]},"DOI":"10.1109\/ewdts63723.2024.10873667","type":"proceedings-article","created":{"date-parts":[[2025,2,18]],"date-time":"2025-02-18T18:15:38Z","timestamp":1739902538000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Advanced Path Delay Fault Testing Strategies in High-Performance Digital Circuits"],"prefix":"10.1109","author":[{"given":"Palanichamy","family":"Manikandan","sequence":"first","affiliation":[{"name":"Institute of Engineering, Østfold University College,Norway"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ramesh","family":"Patel","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology,Department of Electrical Engineering,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sundar","family":"Gopalakrishnan","sequence":"additional","affiliation":[{"name":"Research and Development, Data Consultants AS,Norway"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Karthikeyan","family":"Palaniswamy","sequence":"additional","affiliation":[{"name":"PSG College of Technology,Department of Automobile Engineering,India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/vts.2019.8758662"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tase.2018.2822050"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/s0167-9260(98)00019-4"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/test.2003.1270830"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/icvd.2005.9"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/test.1996.556983"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2014.241"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SECON.1996.510096"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.145"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.49"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470604"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/12.545968"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2008.205"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2003.1195121"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.17"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.261012"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/test.2003.1270885"},{"issue":"2","key":"ref18","first-page":"15","article-title":"International Journal of VLSI Design & Communication Systems (VLSICS)","volume":"5","author":"Dhare","year":"2014","journal-title":"Advanced ATPG Based on Fan, Testability Measures and Fault Reduction"},{"issue":"12","key":"ref19","first-page":"2213","article-title":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"21","author":"Chung","year":"2012","journal-title":"Concurrent Path Selection Algorithm in Statistical Timing Analysis"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2001.915260"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2007.4397301"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.568940"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/43.205000"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/43.363125"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1987.232852"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355681"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2011.6081414"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537869"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855579"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2001.913288"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2008.4662590"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2016.22"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/DASC.2013.50"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140254"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2017.2753201"},{"volume-title":"Exploiting Arithmetic Built-In Self-Test Techniques for Path Delay Fault Testing","year":"2006","author":"Gjermundnes","key":"ref36"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2011.52"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2010.5742129"},{"issue":"11","key":"ref39","first-page":"2345","article-title":"Recent Advances in Path Selection Algorithms for Delay Testing","volume":"41","author":"Bakshi","year":"2020","journal-title":"IEEE Trans. on CAD"}],"event":{"name":"2024 IEEE East-West Design & Test Symposium (EWDTS)","start":{"date-parts":[[2024,11,13]]},"location":"Yerevan, Armenia","end":{"date-parts":[[2024,11,17]]}},"container-title":["2024 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10873596\/10873598\/10873667.pdf?arnumber=10873667","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,20]],"date-time":"2025-02-20T19:53:34Z","timestamp":1740081214000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10873667\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,13]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/ewdts63723.2024.10873667","relation":{},"subject":[],"published":{"date-parts":[[2024,11,13]]}}}