{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T21:04:03Z","timestamp":1780607043934,"version":"3.54.1"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T00:00:00Z","timestamp":1731456000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T00:00:00Z","timestamp":1731456000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,13]]},"DOI":"10.1109\/ewdts63723.2024.10873752","type":"proceedings-article","created":{"date-parts":[[2025,2,18]],"date-time":"2025-02-18T18:15:38Z","timestamp":1739902538000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["Fully Integrated Resistance Calibration Method Using Reference Frequency and MOSFET Capacitance"],"prefix":"10.1109","author":[{"given":"Oleg","family":"Petrosyan","sequence":"first","affiliation":[{"name":"Institute of Information and Telecommunication Technologies and Electronics, National Polytechnical University of Armenia,Yerevan,Armenia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Razmik","family":"Soghomonyan","sequence":"additional","affiliation":[{"name":"National Polytechnical University of Armenia,Chair of Micrelectronic Circuits and Systems,Yerevan,Armenia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hrayr","family":"Sahakyan","sequence":"additional","affiliation":[{"name":"National Polytechnical University of Armenia,Chair of Micrelectronic Circuits and Systems,Yerevan,Armenia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Vahan","family":"Sahakyan","sequence":"additional","affiliation":[{"name":"Institute of Radiophysics and Electronics,National Academy of Sciences of Armenia,Yerevan,Armenia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Arman","family":"Galstyan","sequence":"additional","affiliation":[{"name":"National Polytechnical University of Armenia,Chair of Micrelectronic Circuits and Systems,Yerevan,Armenia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Gaenik","family":"Voskanvan","sequence":"additional","affiliation":[{"name":"Institute of Physics, Yerevan State University,Yerevan,Armenia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Anush","family":"Melikyan","sequence":"additional","affiliation":[{"name":"European University of Armenia,Microelectronic Circuits and Systems of Communication Means,Yerevan,Armenia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"The Art of Electronics","author":"Horowitz","year":"2015"},{"key":"ref2","volume-title":"Design of Analog CMOS Integrated Circuits","author":"Razavi","year":"2001"},{"key":"ref3","volume-title":"CMOS Circuit Design, Layout, and Simulation","author":"Baker","year":"2008"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ELNANO.2013.6552085"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2014.7027071"},{"key":"ref6","first-page":"850","volume-title":"Design Compiler User Guide","year":"2022"},{"key":"ref7","first-page":"2367","volume-title":"VCS User Guide","year":"2022"},{"key":"ref8","first-page":"440","volume-title":"IC Compiler II Design Planning User Guide","year":"2022"},{"key":"ref9","article-title":"14nm Educational Design Kit: Capabilities, Deployment and Future","volume-title":"Small Systems Simulation Symposium","author":"Melikyan"},{"key":"ref10","first-page":"196","volume-title":"Hspice Application Manual","year":"2010"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/5.542410"},{"key":"ref12","volume-title":"The Original USB 2.0 specification","year":"2000"}],"event":{"name":"2024 IEEE East-West Design & Test Symposium (EWDTS)","location":"Yerevan, Armenia","start":{"date-parts":[[2024,11,13]]},"end":{"date-parts":[[2024,11,17]]}},"container-title":["2024 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10873596\/10873598\/10873752.pdf?arnumber=10873752","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,20]],"date-time":"2025-02-20T19:53:17Z","timestamp":1740081197000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10873752\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,13]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ewdts63723.2024.10873752","relation":{},"subject":[],"published":{"date-parts":[[2024,11,13]]}}}