{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T09:25:12Z","timestamp":1725528312495},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/ewme.2016.7496477","type":"proceedings-article","created":{"date-parts":[[2016,6,25]],"date-time":"2016-06-25T07:38:59Z","timestamp":1466840339000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["New QVCO design using UTBB FDSOI technology"],"prefix":"10.1109","author":[{"given":"Gilles","family":"Jacquemod","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhaopeng","family":"Wei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yves","family":"Leduc","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cyril","family":"Jacquemod","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"63","article-title":"vcRO design in 28 nm FDSOI technology using fully complementary inverters","author":"jacquemod","year":"2015","journal-title":"ICSS"},{"key":"ref3","article-title":"SOC Variability Reduction: The UTBB FD-SOI Way","author":"flatresse","year":"2013","journal-title":"VARI Darmstadt"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2011.6056626"},{"key":"ref1","article-title":"Device-Circuit Interplay in the Simulation of Statistical CMOS Variability","author":"asenov","year":"2012","journal-title":"VARI Nice"}],"event":{"name":"2016 11th European Workshop on Microelectronics Education (EWME)","start":{"date-parts":[[2016,5,11]]},"location":"Southampton, United Kingdom","end":{"date-parts":[[2016,5,13]]}},"container-title":["2016 11th European Workshop on Microelectronics Education (EWME)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7492696\/7496453\/07496477.pdf?arnumber=7496477","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T18:55:48Z","timestamp":1475175348000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7496477\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/ewme.2016.7496477","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}