{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T16:30:36Z","timestamp":1773246636621,"version":"3.50.1"},"reference-count":39,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,9,10]],"date-time":"2025-09-10T00:00:00Z","timestamp":1757462400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,10]],"date-time":"2025-09-10T00:00:00Z","timestamp":1757462400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,9,10]]},"DOI":"10.1109\/fdl68117.2025.11165405","type":"proceedings-article","created":{"date-parts":[[2025,9,23]],"date-time":"2025-09-23T17:24:10Z","timestamp":1758648250000},"page":"1-10","source":"Crossref","is-referenced-by-count":1,"title":["LLM-assisted Metamorphic Testing of Embedded Graphics Libraries"],"prefix":"10.1109","author":[{"given":"Christoph","family":"Hazott","sequence":"first","affiliation":[{"name":"Institute for Complex Systems,Johannes"}]},{"given":"Daniel","family":"Gro\u00dfe","sequence":"additional","affiliation":[{"name":"Kepler University Linz,Austria"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/GCCE.2012.6379574"},{"key":"ref2","volume-title":"Better Software. Faster!: Best Practices in Virtual Prototyping","author":"De Schutter","year":"2014"},{"key":"ref3","year":"2023","journal-title":"IEEE Standard for Standard SystemC Language Reference Manual, IEEE Std. 1666 (Revision of IEEE Std 1666-2011)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-90-481-3631-5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-54828-5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-05574-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1201\/9781439889503"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TAICPART.2009.22"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2372785"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2532875"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3143561"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC58780.2024.10473799"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2024.102320"},{"key":"ref14","article-title":"The prompt report: A systematic survey of prompting techniques","author":"Schulhoff","year":"2024"},{"key":"ref18","article-title":"LLM4EDA: Emerging progress in large language models for electronic design automation","author":"Zhong","year":"2023"},{"key":"ref19","article-title":"LLM-aided testbench generation and bug detection for finite-state machines","author":"Bhandari","year":"2024"},{"key":"ref20","doi-asserted-by":"crossref","DOI":"10.1109\/LAD62341.2024.10691792","article-title":"AssertLLM: Generating and evaluating hardware verification assertions from design specifications via multi-LLMs","author":"Fang","year":"2024"},{"key":"ref21","article-title":"Can chatgpt advance software testing intelligence? an experience report on metamorphic testing","author":"Luu","year":"2023"},{"key":"ref22","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-031-70245-7_9","article-title":"Towards generating executable metamorphic relations using large language models","author":"Shin","year":"2024"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC57700.2023.00275"},{"key":"ref24","volume-title":"RepositoryStats","year":"2025"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2012.6164948"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351864"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/SAMOS.2015.7363686"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2846638"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714912"},{"key":"ref31","first-page":"188:1","article-title":"Early concolic testing of embedded binaries with virtual prototypes: A RISC-V case study","volume-title":"Design Automation Conference","author":"Herdt"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218494"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530604"},{"key":"ref34","article-title":"RISC-V VP++: Next generation open-source virtual prototype","volume-title":"Workshop on Open-Source Design Automation","author":"Schl\u00e4gl"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/3583781.3590253"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.23919\/DATE58400.2024.10546838"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/3676536.3676755"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.23919\/DATE64628.2025.10992929"},{"key":"ref39","first-page":"569","article-title":"Case studies on the selection of useful relations in metamorphic testing","volume-title":"The Ibero-American Conference on Software Engineering and Knowledge Engineering","author":"Chen"},{"key":"ref43","first-page":"34","article-title":"DSA monitoring framework for HW\/SW partitioning of application kernels leveraging VPs","volume-title":"IEEE Design and Verification Conference and Exhibition Europe","author":"Hazott"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ETS61313.2024.10567598"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS63720.2025.11006679"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2024.3387312"}],"event":{"name":"2025 Forum on Specification & Design Languages (FDL)","location":"St. Goar, Germany","start":{"date-parts":[[2025,9,10]]},"end":{"date-parts":[[2025,9,12]]}},"container-title":["2025 Forum on Specification & Design Languages (FDL)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11165265\/11165266\/11165405.pdf?arnumber=11165405","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T05:15:31Z","timestamp":1759295731000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11165405\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9,10]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/fdl68117.2025.11165405","relation":{},"subject":[],"published":{"date-parts":[[2025,9,10]]}}}