{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T01:17:21Z","timestamp":1725499041949},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,8]]},"DOI":"10.1109\/fpl.2009.5272477","type":"proceedings-article","created":{"date-parts":[[2009,9,30]],"date-time":"2009-09-30T18:42:09Z","timestamp":1254336129000},"page":"467-471","source":"Crossref","is-referenced-by-count":4,"title":["An approach to system-wide fault tolerance for FPGAs"],"prefix":"10.1109","author":[{"given":"Jano","family":"Gebelein","sequence":"first","affiliation":[]},{"given":"Heiko","family":"Engel","sequence":"additional","affiliation":[]},{"given":"Udo","family":"Kebschull","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"13"},{"article-title":"entwurf und implementierung eines adaptiven, strahlentoleranten eingebetteten systems am beispiel eines read-out-controllers","year":"2009","author":"mu?ller-klieser","key":"14"},{"key":"11","article-title":"reliability of programmable input\/output pins in the presence of configuration upsets","author":"rollins","year":"2002","journal-title":"Proc of Military and Aerospace Applications of Programmable Logic Devices MAPLD"},{"journal-title":"MIPS RISC Architecture","year":"1991","author":"kane","key":"12"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.1993.316519"},{"key":"2","article-title":"single-event upsets in sram fpgas","author":"caffrey","year":"2002","journal-title":"Proc of Military and Aerospace Applications of Programmable Logic Devices MAPLD"},{"year":"0","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/1022348.1008538"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.46"},{"key":"6","article-title":"single event transient phenomena - challenges and solutions","author":"mavis","year":"2002","journal-title":"2002 Microelectronics Reliability and Quali-fication Workshop"},{"year":"0","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/1113841.1113843"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910871"}],"event":{"name":"2009 International Conference on Field Programmable Logic and Applications (FPL)","start":{"date-parts":[[2009,8,31]]},"location":"Prague, Czech Republic","end":{"date-parts":[[2009,9,2]]}},"container-title":["2009 International Conference on Field Programmable Logic and Applications"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5247666\/5272229\/05272477.pdf?arnumber=5272477","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T05:48:10Z","timestamp":1489902490000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5272477\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,8]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/fpl.2009.5272477","relation":{},"subject":[],"published":{"date-parts":[[2009,8]]}}}