{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T04:41:19Z","timestamp":1725770479409},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,12]]},"DOI":"10.1109\/fpt.2010.5681775","type":"proceedings-article","created":{"date-parts":[[2011,1,7]],"date-time":"2011-01-07T14:09:43Z","timestamp":1294409383000},"page":"162-169","source":"Crossref","is-referenced-by-count":3,"title":["A robust reconfigurable logic device based on less configuration memory logic cell"],"prefix":"10.1109","author":[{"given":"Qian","family":"Zhao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yoshihiro","family":"Ichinomiya","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yasuhiro","family":"Okamoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Motoki","family":"Amagasaki","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Masahiro","family":"Iida","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toshinori","family":"Sueyoshi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Single Event Upset (SEU) Detection and Correction Using Virtex-4 Devices","author":"jones","year":"2007","journal-title":"XAPP 714 (v1 5)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2033796"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.243959"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2007.4397290"},{"journal-title":"ABC A System for Sequential Synthesis and Verification","article-title":"Berkeley Logic Synthesis and Verification Group","year":"2007","key":"ref14"},{"key":"ref15","first-page":"164","article-title":"Universal Logic Gate for FPGA Design","author":"lin","year":"1994","journal-title":"Proc ICCAD"},{"key":"ref16","first-page":"143","article-title":"FPGA Technology Mapping with Encoded Libraries and Staged Priority Cuts","author":"kennings","year":"2009","journal-title":"Proc FPGA2009"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/FCCM.2006.71"},{"key":"ref18","article-title":"Soft-error Tolerability Analysis for Triplicated Circuit on an FPGA","author":"ichinomiya","year":"2010","journal-title":"Proc SASIMI20 1 0"},{"journal-title":"Device Reliability Report","year":"2010","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2009.5272319"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2008.4629973"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/611817.611834"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.25"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2008.4538760"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2007.5205603"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2010.68"},{"key":"ref1","article-title":"Continuing Experiments of Atmospheric Neutron Effects on Deep Submicron Integrated Circuits","author":"lesea","year":"2009","journal-title":"WP286 (v1 0 1) Xilinx Inc"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-5145-4"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173252"}],"event":{"name":"2010 International Conference on Field-Programmable Technology (FPT)","start":{"date-parts":[[2010,12,8]]},"location":"Beijing, China","end":{"date-parts":[[2010,12,10]]}},"container-title":["2010 International Conference on Field-Programmable Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5677390\/5681421\/05681775.pdf?arnumber=5681775","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T04:23:18Z","timestamp":1490070198000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5681775\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,12]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/fpt.2010.5681775","relation":{},"subject":[],"published":{"date-parts":[[2010,12]]}}}