{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,27]],"date-time":"2025-08-27T00:19:22Z","timestamp":1756253962572,"version":"3.44.0"},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2013,10,1]],"date-time":"2013-10-01T00:00:00Z","timestamp":1380585600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2013,10,1]],"date-time":"2013-10-01T00:00:00Z","timestamp":1380585600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1109\/gcce.2013.6664895","type":"proceedings-article","created":{"date-parts":[[2013,11,27]],"date-time":"2013-11-27T16:57:12Z","timestamp":1385571432000},"page":"48-49","source":"Crossref","is-referenced-by-count":2,"title":["Background subtraction based object extraction for Time-of-Flight sensor"],"prefix":"10.1109","author":[{"given":"Shung Han","family":"Cho","sequence":"first","affiliation":[{"name":"System LSI Business, Samsung Electronics, Yongin-City, Gyeonggi-Do, 446-711 South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kwanghyuk","family":"Bae","sequence":"additional","affiliation":[{"name":"System LSI Business, Samsung Electronics, Yongin-City, Gyeonggi-Do, 446-711 South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kyu-Min","family":"Kyung","sequence":"additional","affiliation":[{"name":"System LSI Business, Samsung Electronics, Yongin-City, Gyeonggi-Do, 446-711 South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seongyeong","family":"Jeong","sequence":"additional","affiliation":[{"name":"System LSI Business, Samsung Electronics, Yongin-City, Gyeonggi-Do, 446-711 South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tae-Chan","family":"Kim","sequence":"additional","affiliation":[{"name":"System LSI Business, Samsung Electronics, Yongin-City, Gyeonggi-Do, 446-711 South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/34.868683"},{"year":"0","key":"2"},{"key":"1","article-title":"Multiple frequency range imaging to remove measurement ambiguity","author":"payne","year":"2009","journal-title":"Proc of Conf on Optical 3-D Measurement Techniques"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/SIBGRAPI.2005.15"}],"event":{"name":"2013 IEEE 2nd Global Conference on Consumer Electronics (GCCE)","start":{"date-parts":[[2013,10,1]]},"location":"Tokyo, Japan","end":{"date-parts":[[2013,10,4]]}},"container-title":["2013 IEEE 2nd Global Conference on Consumer Electronics (GCCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6653324\/6664739\/06664895.pdf?arnumber=6664895","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,26]],"date-time":"2025-08-26T19:07:30Z","timestamp":1756235250000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6664895\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/gcce.2013.6664895","relation":{},"subject":[],"published":{"date-parts":[[2013,10]]}}}