{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T17:32:02Z","timestamp":1730223122037,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,18]],"date-time":"2022-10-18T00:00:00Z","timestamp":1666051200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,18]],"date-time":"2022-10-18T00:00:00Z","timestamp":1666051200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,18]]},"DOI":"10.1109\/gcce56475.2022.10014218","type":"proceedings-article","created":{"date-parts":[[2023,1,18]],"date-time":"2023-01-18T18:53:09Z","timestamp":1674067989000},"page":"561-565","source":"Crossref","is-referenced-by-count":0,"title":["Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation"],"prefix":"10.1109","author":[{"given":"Tsutomu","family":"Inamoto","sequence":"first","affiliation":[{"name":"Ehime University 3 Bunkyo, Matsuyama,Graduate School of Science and Engineering,Ehime,Japan,791-8577"}],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Tomoki","family":"Nishino","sequence":"additional","affiliation":[{"name":"INFOCOM WEST JAPAN CORPORATION 1-6-29 Kyutaro-machi, Chuo-ku,Osaka,Japan,541-0056"}],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Senling","family":"Wang","sequence":"additional","affiliation":[{"name":"Ehime University 3 Bunkyo, Matsuyama,Graduate School of Science and Engineering,Ehime,Japan,791-8577"}],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Yoshinobu","family":"Higami","sequence":"additional","affiliation":[{"name":"Ehime University 3 Bunkyo, Matsuyama,Graduate School of Science and Engineering,Ehime,Japan,791-8577"}],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Hiroshi","family":"Takahashi","sequence":"additional","affiliation":[{"name":"Ehime University 3 Bunkyo, Matsuyama,Graduate School of Science and Engineering,Ehime,Japan,791-8577"}],"role":[{"role":"author","vocab":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1017\/cbo9780511816321"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-CSCC52171.2021.9501263"},{"key":"ref3","first-page":"677","article-title":"A neutral netlist of 10 combinational benchmark circuits and a target translator in fortran","volume-title":"Proceedings of the IEEE Int\u2019l Symposium Circuits and Systems (ISCAS \u201985)","author":"Brglez"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/0898-1221(87)90081-2"},{"volume-title":"Electrically programmable read only memory array","year":"1973","author":"Frohman-Bentchkowsky","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICRITO.2015.7359339"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1968.1049924"},{"key":"ref9","first-page":"137","article-title":"Regeneration of test patterns for BIST by using artificial neural networks","volume-title":"Proceedings of The 35th International Technical Conference on Circuits\/Systems Computers and Communications (ITC-CSCC 2020)","author":"Inamoto"},{"key":"ref10","article-title":"Generative adversarial nets","volume":"27","author":"Goodfellow","year":"2014","journal-title":"Advances in neural information processing systems"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1674-4926\/42\/1\/013104"},{"article-title":"Simulation program with integrated circuit emphasis (SPICE)","year":"1973","author":"Nagel","key":"ref12"}],"event":{"name":"2022 IEEE 11th Global Conference on Consumer Electronics (GCCE)","start":{"date-parts":[[2022,10,18]]},"location":"Osaka, Japan","end":{"date-parts":[[2022,10,21]]}},"container-title":["2022 IEEE 11th Global Conference on Consumer Electronics (GCCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10013950\/10014027\/10014218.pdf?arnumber=10014218","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T06:54:00Z","timestamp":1707807240000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10014218\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,18]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/gcce56475.2022.10014218","relation":{},"subject":[],"published":{"date-parts":[[2022,10,18]]}}}